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Thad Gilbert Walker
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Madison, WI, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electrometer sensor control system
Patent number
11,726,123
Issue date
Aug 15, 2023
Northrop Grumman Systems Corporation
Thad G. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Electrometer with Rydberg frequency tuning
Patent number
11,674,992
Issue date
Jun 13, 2023
Northrop Grumman Systems Corporation
Thad G. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Synchronous light-pulse atomic magnetometer system
Patent number
11,294,005
Issue date
Apr 5, 2022
Northrop Grumman Systems Corporation
Thad G. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Atomic interferometer system
Patent number
11,133,117
Issue date
Sep 28, 2021
Northrop Grumman Systems Corporation
Michael S. Larsen
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed-beam atomic magnetometer system
Patent number
10,823,790
Issue date
Nov 3, 2020
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Pulsed-beam atomic magnetometer system
Patent number
10,782,368
Issue date
Sep 22, 2020
Northrop Grumman Systems Corporation
Michael D. Bulatowicz
G01 - MEASURING TESTING
Information
Patent Grant
Atomic clock system
Patent number
10,725,431
Issue date
Jul 28, 2020
Northrop Grumman Systems Corporation
Michael S. Larsen
G04 - HOROLOGY
Information
Patent Grant
Atomic clock system
Patent number
10,539,929
Issue date
Jan 21, 2020
Northrop Grumman Systems Corporation
Michael S. Larsen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Nuclear magnetic resonance probe system
Patent number
9,970,999
Issue date
May 15, 2018
Northrop Grumman Systems Corporation
Michael S. Larsen
G01 - MEASURING TESTING
Information
Patent Grant
Gas magnetometer
Patent number
9,329,152
Issue date
May 3, 2016
Wisconsin Alumni Research Foundation
Thad Gilbert Walker
G01 - MEASURING TESTING
Information
Patent Grant
Atomic far-off resonance trap (FORT) accelerometer system
Patent number
9,234,912
Issue date
Jan 12, 2016
Northrop Grumman Systems Corporation
Thad G. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Systems and method to substantially mitigate AC stark shift effects...
Patent number
9,229,073
Issue date
Jan 5, 2016
Northrop Grumman Guidance and Electronics Company, Inc.
Thad G. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Noble gas magnetic resonator
Patent number
8,698,493
Issue date
Apr 15, 2014
Wisconsin Alumni Research Foundation
Thad Gilbert Walker
G01 - MEASURING TESTING
Information
Patent Grant
Frequency-narrowed high power diode laser system with external cavity
Patent number
6,868,099
Issue date
Mar 15, 2005
Wisconsin Alumni Research Foundation
Thad G. Walker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Frequency-narrowed high power diode laser array method and system
Patent number
6,584,133
Issue date
Jun 24, 2003
Wisconsin Alumni Research Foundation
Thad G. Walker
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Coherent Light Source Based on Collective Spontaneous Emission
Publication number
20230318246
Publication date
Oct 5, 2023
Wisconsin Alumni Research Foundation
Deniz Yavuz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTROMETER SENSOR CONTROL SYSTEM
Publication number
20220196719
Publication date
Jun 23, 2022
Northrop Grumman Systems Corporation
THAD G. WALKER
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMETER WITH RYDBERG FREQUENCY TUNING
Publication number
20220196718
Publication date
Jun 23, 2022
Northrop Grumman Systems Corporation
THAD G. WALKER
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC MAGNETOMETER SYSTEM
Publication number
20220018913
Publication date
Jan 20, 2022
Northrop Grumman Systems Corporation
THAD G. WALKER
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC INTERFEROMETER SYSTEM
Publication number
20200357534
Publication date
Nov 12, 2020
Northrop Grumman Systems Corporation
MICHAEL S. LARSEN
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC CLOCK SYSTEM
Publication number
20200117146
Publication date
Apr 16, 2020
Northrop Grumman Systems Corporation
MICHAEL S. LARSEN
G04 - HOROLOGY
Information
Patent Application
PULSED-BEAM ATOMIC MAGNETOMETER SYSTEM
Publication number
20180372813
Publication date
Dec 27, 2018
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
PULSED-BEAM ATOMIC MAGNETOMETER SYSTEM
Publication number
20180348313
Publication date
Dec 6, 2018
Northrop Grumman Systems Corporation
MICHAEL D. BULATOWICZ
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC CLOCK SYSTEM
Publication number
20180101139
Publication date
Apr 12, 2018
Northrop Grumman Systems Corporation
MICHAEL S. LARSEN
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SYSTEMS AND METHOD TO SUBSTANTIALLY MITIGATE AC STARK SHIFT EFFECTS...
Publication number
20140184216
Publication date
Jul 3, 2014
THAD G. WALKER
G01 - MEASURING TESTING
Information
Patent Application
NUCLEAR MAGNETIC RESONANCE PROBE SYSTEM
Publication number
20130328557
Publication date
Dec 12, 2013
Northrop Grumman Systems Corporation
MICHAEL S. LARSEN
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC FAR-OFF RESONANCE TRAP (FORT) ACCELEROMETER SYSTEM
Publication number
20130327145
Publication date
Dec 12, 2013
Northrop Grumman Systems Corporation
Thad G. Walker
G01 - MEASURING TESTING
Information
Patent Application
Gas Magnetometer
Publication number
20130033255
Publication date
Feb 7, 2013
Thad Gilbert Walker
G01 - MEASURING TESTING
Information
Patent Application
Noble Gas Magnetic Resonator
Publication number
20130033261
Publication date
Feb 7, 2013
Thad Gilbert Walker
G01 - MEASURING TESTING