Thanh Huy HA

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fast and robust initialization method for feature-based monocular v...
- Patent number 12,115,685
- Issue date Oct 15, 2024
- MIDEA GROUP CO., LTD.
- Thanh Huy Ha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for reducing false positives in object detection...
- Patent number 11,790,041
- Issue date Oct 17, 2023
- MIDEA GROUP CO., LTD.
- Thanh Huy Ha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for recommending object placement
- Patent number 11,439,292
- Issue date Sep 13, 2022
- MIDEA GROUP CO. LTD.
- Thanh Huy Ha
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Grant
Adjusting machine settings through multi-pass training of object de...
- Patent number 11,120,311
- Issue date Sep 14, 2021
- MIDEA GROUP CO., LTD.
- Thanh Huy Ha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for controlling machines based on object recognition
- Patent number 11,048,976
- Issue date Jun 29, 2021
- MIDEA GROUP CO., LTD.
- Yunke Tian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope objective lens calibration using X-Y v...
- Patent number 10,790,114
- Issue date Sep 29, 2020
- KLA-Tencor Corporation
- Ichiro Honjo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Learning based approach for aligning images acquired with different...
- Patent number 10,733,744
- Issue date Aug 4, 2020
- KLA-Tencor Corp.
- Thanh Huy Ha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated pattern fidelity measurement plan generation
- Patent number 10,670,535
- Issue date Jun 2, 2020
- KLA-Tencor Corp.
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
Automated pattern fidelity measurement plan generation
- Patent number 10,267,746
- Issue date Apr 23, 2019
- KLA-Tencor Corp.
- Brian Duffy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determining multi-patterning step overlay error
- Patent number 10,062,543
- Issue date Aug 28, 2018
- KLA-Tencor Corp.
- Ajay Gupta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contour-based array inspection of patterned defects
- Patent number 9,483,819
- Issue date Nov 1, 2016
- KLA-Tencor Corporation
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Reducing False Positives in Object Detection...
- Publication number 20230169150
- Publication date Jun 1, 2023
- MIDEA GROUP CO., LTD.
- Thanh Huy HA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fast and Robust Initialization Method for Feature-Based Monocular V...
- Publication number 20230010105
- Publication date Jan 12, 2023
- MIDEA GROUP CO., LTD.
- Thanh Huy HA
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Method and System for Controlling Machines Based on Object Recognition
- Publication number 20210142110
- Publication date May 13, 2021
- MIDEA GROUP CO., LTD.
- Yunke Tian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Recommending Object Placement
- Publication number 20210127943
- Publication date May 6, 2021
- Media Group Co., LTD.
- Thanh Huy Ha
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...
Information Patent Application
Adjusting Machine Settings Through Multi-Pass Training of Object De...
- Publication number 20210117717
- Publication date Apr 22, 2021
- MIDEA GROUP CO., LTD.
- Thanh Huy Ha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Pattern Fidelity Measurement Plan Generation
- Publication number 20190204237
- Publication date Jul 4, 2019
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
Scanning Electron Microscope Objective Lens Calibration
- Publication number 20190004298
- Publication date Jan 3, 2019
- KLA-Tencor Corporation
- Ichiro Honjo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEARNING BASED APPROACH FOR ALIGNING IMAGES ACQUIRED WITH DIFFERENT...
- Publication number 20180330511
- Publication date Nov 15, 2018
- KLA-Tencor Corporation
- Thanh Huy Ha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING MULTI-PATTERNING STEP OVERLAY ERROR
- Publication number 20160377425
- Publication date Dec 29, 2016
- KLA-Tencor Corporation
- Ajay Gupta
- G01 - MEASURING TESTING
Information Patent Application
Automated Pattern Fidelity Measurement Plan Generation
- Publication number 20160116420
- Publication date Apr 28, 2016
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
CONTOUR-BASED ARRAY INSPECTION OF PATTERNED DEFECTS
- Publication number 20140212024
- Publication date Jul 31, 2014
- KLA-Tencor Corporation
- Chien-Huei CHEN
- G01 - MEASURING TESTING

Thanh Huy HA

Person

Patents Grantslast 30 patents

Fast and robust initialization method for feature-based monocular v...

Method and system for reducing false positives in object detection...

System and method for recommending object placement

Adjusting machine settings through multi-pass training of object de...

Method and system for controlling machines based on object recognition

Scanning electron microscope objective lens calibration using X-Y v...

Learning based approach for aligning images acquired with different...

Automated pattern fidelity measurement plan generation

Automated pattern fidelity measurement plan generation

Determining multi-patterning step overlay error

Contour-based array inspection of patterned defects

Patents Applicationslast 30 patents

Method and System for Reducing False Positives in Object Detection...

Fast and Robust Initialization Method for Feature-Based Monocular V...

Method and System for Controlling Machines Based on Object Recognition

System and Method for Recommending Object Placement

Adjusting Machine Settings Through Multi-Pass Training of Object De...

Automated Pattern Fidelity Measurement Plan Generation

Scanning Electron Microscope Objective Lens Calibration

LEARNING BASED APPROACH FOR ALIGNING IMAGES ACQUIRED WITH DIFFERENT...

DETERMINING MULTI-PATTERNING STEP OVERLAY ERROR

Automated Pattern Fidelity Measurement Plan Generation

CONTOUR-BASED ARRAY INSPECTION OF PATTERNED DEFECTS