Thanh-Liem Nguyen

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Meudon, FR

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Patents Grantslast 30 patents

Information Patent Grant
Instantaneous ellipsometer or scatterometer and associated measurin...
- Patent number 11,175,221
- Issue date Nov 16, 2021
- HORIBA FRANCE SAS
- Olivier Acher
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront-division polarimetric analysis method and device, spectro...
- Patent number 9,551,618
- Issue date Jan 24, 2017
- HORIBA Jobin Yvon SAS
- Olivier Acher
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSTANTANEOUS ELLIPSOMETER OR SCATTEROMETER AND ASSOCIATED MEASURIN...
- Publication number 20210010928
- Publication date Jan 14, 2021
- HORIBA FRANCE SAS
- Olivier ACHER
- G02 - OPTICS
Information Patent Application
WAVEFRONT-DIVISION POLARIMETRIC ANALYSIS METHOD AND DEVICE, SPECTRO...
- Publication number 20150204724
- Publication date Jul 23, 2015
- HORIBA JOBIN YVON SAS
- Olivier Acher
- G01 - MEASURING TESTING