Thantip KRASIENAPIBAL

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Patents Grantslast 30 patents

Information Patent Grant
Measurement system and method for setting observation conditions of...
- Patent number 11,380,518
- Issue date Jul 5, 2022
- Hitachi, Ltd.
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing system and information processing method
- Patent number 11,334,761
- Issue date May 17, 2022
- Hitachi, Ltd.
- Thantip Krasienapibal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and image processing apparatus
- Patent number 10,483,083
- Issue date Nov 19, 2019
- Hitachi, Ltd.
- Thantip Krasienapibal
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Support System and Support Method
- Publication number 20240405601
- Publication date Dec 5, 2024
- Hitachi, Ltd
- Takashi TAKEMOTO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
AREA DESIGN PROPOSAL SYSTEM AND AREA DESIGN PROPOSAL METHOD
- Publication number 20240394428
- Publication date Nov 28, 2024
- Hitachi, Ltd
- Mamoru OKAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement System and Method for Setting Observation Conditions of...
- Publication number 20210407763
- Publication date Dec 30, 2021
- Hitachi, Ltd
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING SYSTEM AND INFORMATION PROCESSING METHOD
- Publication number 20200257937
- Publication date Aug 13, 2020
- Hitachi, Ltd
- Thantip KRASIENAPIBAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND IMAGE PROCESSING APPARATUS
- Publication number 20190035597
- Publication date Jan 31, 2019
- Hitachi, Ltd
- Thantip KRASIENAPIBAL
- G06 - COMPUTING CALCULATING COUNTING