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Theodore B. Ladewski
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Ann Abor, MI, US
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last 30 patents
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Patent Grant
Method and apparatus for determining optical quality
Patent number
6,208,412
Issue date
Mar 27, 2001
Visteon Global Technologies, Inc.
Theodore B. Ladewski
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining reflective optical quality usi...
Patent number
6,100,990
Issue date
Aug 8, 2000
Ford Motor Company
Theodore B. Ladewski
G01 - MEASURING TESTING
Information
Patent Grant
Methods of correcting optically generated errors in an electro-opti...
Patent number
5,517,575
Issue date
May 14, 1996
Theodore B. Ladewski
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optical system for gauging specular surface profile deviations
Patent number
5,465,153
Issue date
Nov 7, 1995
KMS Fusion, Inc.
Theodore B. Ladewski
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optical system for gauging surface profile deviations using...
Patent number
5,463,464
Issue date
Oct 31, 1995
KMS Fusion, Inc.
Theodore B. Ladewski
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optical system for gauging surface profile deviations
Patent number
5,438,417
Issue date
Aug 1, 1995
KMS Fusion, Inc.
Garland F. Busch
G01 - MEASURING TESTING
Information
Patent Grant
Electro-optical system for gauging surface profile deviations
Patent number
5,289,267
Issue date
Feb 22, 1994
KMS Fusion, Inc.
Garland E. Busch
G01 - MEASURING TESTING