Theodore M. Levin

Person

Burlington, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of changing reflectance or resistance of a region in an opto...
- Patent number 8,945,955
- Issue date Feb 3, 2015
- International Business Machines Corporation
- Fen Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Optoelectronic memory devices
- Patent number 8,288,747
- Issue date Oct 16, 2012
- International Business Machines Corporation
- Fen Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Optoelectronic memory devices
- Patent number 7,768,815
- Issue date Aug 3, 2010
- International Business Machines Corporation
- Fen Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Nanoscale fault isolation and measurement system
- Patent number 7,671,604
- Issue date Mar 2, 2010
- International Business Machines Corporation
- Philip V. Kaszuba
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale fault isolation and measurement system
- Patent number 7,511,510
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Philip V. Kaszuba
- G01 - MEASURING TESTING
Information Patent Grant
Sensor differentiated fault isolation
- Patent number 7,397,263
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Kevin L. Condon
- G01 - MEASURING TESTING
Information Patent Grant
Sensor differentiated fault isolation
- Patent number 7,202,689
- Issue date Apr 10, 2007
- International Business Machines Corporation
- Kevin L. Condon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for transmission and remote sensing of signals...
- Patent number 7,116,094
- Issue date Oct 3, 2006
- International Business Machines Corporation
- Theodore M. Levin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for assisting backside focused ion beam device modification
- Patent number 6,566,681
- Issue date May 20, 2003
- International Business Machines Corporation
- David E. Lackey
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF CHANGING REFLECTANCE OR RESISTANCE OF A REGION IN AN OPTO...
- Publication number 20130258765
- Publication date Oct 3, 2013
- International Business Machines Corporation
- Fen Chen
- G11 - INFORMATION STORAGE
Information Patent Application
OPTOELECTRONIC MEMORY DEVICES
- Publication number 20120287707
- Publication date Nov 15, 2012
- International Business Machines Corporation
- Fen Chen
- G11 - INFORMATION STORAGE
Information Patent Application
OPTOELECTRONIC MEMORY DEVICES
- Publication number 20100290264
- Publication date Nov 18, 2010
- International Business Machines Corporation
- Fen Chen
- G11 - INFORMATION STORAGE
Information Patent Application
NANOSCALE FAULT ISOLATION AND MEASUREMENT SYSTEM
- Publication number 20080238457
- Publication date Oct 2, 2008
- International Business Machines Corporation
- Philip V. Kaszuba
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE FAULT ISOLATION AND MEASUREMENT SYSTEM
- Publication number 20070222456
- Publication date Sep 27, 2007
- International Business Machines Corporation
- Philip V. Kaszuba
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DIFFERENTIATED FAULT ISOLATION
- Publication number 20070126450
- Publication date Jun 7, 2007
- Kevin L. Condon
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRONIC MEMORY DEVICES
- Publication number 20070051875
- Publication date Mar 8, 2007
- International Business Machines Corporation
- Fen Chen
- G11 - INFORMATION STORAGE
Information Patent Application
SENSOR DIFFERENTIATED FAULT ISOLATION
- Publication number 20060232284
- Publication date Oct 19, 2006
- International Business Machines Corporation
- Kevin L. Condon
- G01 - MEASURING TESTING
Information Patent Application
AN APPARATUS AND METHOD FOR TRANSMISSION AND REMOTE SENSING OF SIGN...
- Publication number 20060022671
- Publication date Feb 2, 2006
- International Business Machines Corporation
- Theodore M. Levin
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for assisting backside focused ion beam device modification
- Publication number 20030015671
- Publication date Jan 23, 2003
- International Business Machines Corporation
- David E. Lackey
- H01 - BASIC ELECTRIC ELEMENTS

Theodore M. Levin

Person

Patents Grantslast 30 patents

Method of changing reflectance or resistance of a region in an opto...

Optoelectronic memory devices

Optoelectronic memory devices

Nanoscale fault isolation and measurement system

Nanoscale fault isolation and measurement system

Sensor differentiated fault isolation

Sensor differentiated fault isolation

Apparatus and method for transmission and remote sensing of signals...

Apparatus for assisting backside focused ion beam device modification

Patents Applicationslast 30 patents

METHOD OF CHANGING REFLECTANCE OR RESISTANCE OF A REGION IN AN OPTO...

OPTOELECTRONIC MEMORY DEVICES

OPTOELECTRONIC MEMORY DEVICES

NANOSCALE FAULT ISOLATION AND MEASUREMENT SYSTEM

NANOSCALE FAULT ISOLATION AND MEASUREMENT SYSTEM

SENSOR DIFFERENTIATED FAULT ISOLATION

OPTOELECTRONIC MEMORY DEVICES

SENSOR DIFFERENTIATED FAULT ISOLATION

AN APPARATUS AND METHOD FOR TRANSMISSION AND REMOTE SENSING OF SIGN...

Apparatus for assisting backside focused ion beam device modification