Theodore R. Lundquist

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
FIB milling of copper over organic dielectrics
- Patent number 7,883,630
- Issue date Feb 8, 2011
- DCG Systems, Inc.
- Vladimir V. Makarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for optical interference fringe based integrat...
- Patent number 7,884,024
- Issue date Feb 8, 2011
- DCG Systems, Inc.
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems of performing device failure analysis, electric...
- Patent number 7,842,920
- Issue date Nov 30, 2010
- DCG Systems, Inc.
- Theodore R. Lundquist
- B82 - NANO-TECHNOLOGY
Information Patent Grant
FIB based open via analysis and repair
- Patent number 7,786,436
- Issue date Aug 31, 2010
- DCG Systems, Inc.
- Theodore R. Lundquist
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for optical interference fringe based integrat...
- Patent number 7,697,146
- Issue date Apr 13, 2010
- DCG Systems, Inc.
- Erwan Le Roy
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for circuit operation definition
- Patent number 7,530,034
- Issue date May 5, 2009
- DCG Systems, Inc.
- Martin Betz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method of forming silicide in a localized manner
- Patent number 7,439,168
- Issue date Oct 21, 2008
- DCG Systems, Inc.
- Christian Boit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sub-resolution alignment of images
- Patent number 7,409,653
- Issue date Aug 5, 2008
- DCG Systems, Inc.
- Madhumita Sengupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,400,154
- Issue date Jul 15, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for integrated circuit backside navigation
- Patent number 7,135,123
- Issue date Nov 14, 2006
- Credence Systems Corporation
- Mark Alan Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle guide
- Patent number 7,135,678
- Issue date Nov 14, 2006
- Credence Systems Corporation
- Qinsong Steve Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for addressing thickness variations of a trenc...
- Patent number 7,115,426
- Issue date Oct 3, 2006
- Credence Systems Corporation
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FIB milling of copper over organic dielectrics
- Patent number 7,060,196
- Issue date Jun 13, 2006
- Credence Systems Corporation
- Vladimir V. Makarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Imaging integrated circuits with focused ion beam
- Patent number 7,036,109
- Issue date Apr 25, 2006
- Credence Systems Corporation
- Chun-Cheng Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 6,943,572
- Issue date Sep 13, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Precise, in-situ endpoint detection for charged particle beam proce...
- Patent number 6,905,623
- Issue date Jun 14, 2005
- Credence Systems Corporation
- Theodore R. Lundquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring back-side voltage of an integrated circuit
- Patent number 6,872,581
- Issue date Mar 29, 2005
- NPTest, Inc.
- Christopher Shaw
- G01 - MEASURING TESTING
Information Patent Grant
Sub-resolution alignment of images
- Patent number 6,848,087
- Issue date Jan 25, 2005
- Credence Systems Corporation
- Madhumita Sengupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam system with optical microscope
- Patent number 5,905,266
- Issue date May 18, 1999
- Schlumberger Technologies, Inc.
- Xavier Larduinat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FBI etching enhanced with 1,2 di-iodo-ethane
- Patent number 5,840,630
- Issue date Nov 24, 1998
- Schlumberger Technologies Inc.
- Michael A. Cecere
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
HIGH FREQUENCY LOCK-IN THERMOGRAPHY USING SINGLE PHOTON DETECTORS
- Publication number 20180180670
- Publication date Jun 28, 2018
- FEI Company
- Euan Ramsay
- G01 - MEASURING TESTING
Information Patent Application
Particle Beam Heating to Identify Defects
- Publication number 20160370425
- Publication date Dec 22, 2016
- DCG SYSTEMS, INC.
- Richard Stallcup
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONIZED PULSED LADA FOR THE SIMULTANEOUS ACQUISITION OF TIMING...
- Publication number 20140285227
- Publication date Sep 25, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Keith Serrels
- G01 - MEASURING TESTING
Information Patent Application
FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS
- Publication number 20090114851
- Publication date May 7, 2009
- Vladimir V. Makarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SUB-RESOLUTION ALIGNMENT OF IMAGES
- Publication number 20080298719
- Publication date Dec 4, 2008
- DCG SYSTEMS, INC.
- Madhumita Sengupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS OF PERFORMING DEVICE FAILURE ANALYSIS, ELECTRIC...
- Publication number 20080142711
- Publication date Jun 19, 2008
- CREDENCE SYSTEMS CORPORATION
- Theodore R. Lundquist
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INTEGRATED CIRCUIT DESIGN FOR CIRCUIT EDIT
- Publication number 20080028345
- Publication date Jan 31, 2008
- Credence Systems Corporation
- Hitesh Suri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR OPTICAL INTERFERENCE FRINGE BASED INTEGRAT...
- Publication number 20070293052
- Publication date Dec 20, 2007
- Credence Systems Corporation
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for circuit operation definition
- Publication number 20060261043
- Publication date Nov 23, 2006
- Credence Systems Corporation
- Martin Betz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS
- Publication number 20060219949
- Publication date Oct 5, 2006
- Credence Systems Corporation
- Vladimir V. Makarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Apparatus and method for optical interference fringe based integrat...
- Publication number 20060188797
- Publication date Aug 24, 2006
- Credence Systems Corporation
- Erwan Le Roy
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus and method of forming silicide in a localized manner
- Publication number 20060079086
- Publication date Apr 13, 2006
- Credence Systems Corporation
- Christian Boit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for addressing thickness variations of a trenc...
- Publication number 20060030064
- Publication date Feb 9, 2006
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle guide
- Publication number 20060006329
- Publication date Jan 12, 2006
- Qinsong Steve Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20050231219
- Publication date Oct 20, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Precise, in-situ endpoint detection for charged particle beam proce...
- Publication number 20050109956
- Publication date May 26, 2005
- Theodore R. Lundquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIB milling of copper over organic dielectrics
- Publication number 20050072756
- Publication date Apr 7, 2005
- Vladimir V. Makarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Sub-resolution alignment of images
- Publication number 20050044519
- Publication date Feb 24, 2005
- NPTEST, LLC, a Delaware corporation
- Madhumita Sengupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods of using measured time resolved photon emission data and si...
- Publication number 20050024057
- Publication date Feb 3, 2005
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20040189335
- Publication date Sep 30, 2004
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Method for surface preparation to enable uniform etching of polycry...
- Publication number 20040084407
- Publication date May 6, 2004
- NPTEST, INC.
- Vladimir V. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for surface preparation to enable uniform etching of polycry...
- Publication number 20040084408
- Publication date May 6, 2004
- NPTEST, INC.
- Vladimir V. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for backside die thinning and polishing of packaged integrat...
- Publication number 20040014401
- Publication date Jan 22, 2004
- Chun-Cheng Tsao
- B24 - GRINDING POLISHING
Information Patent Application
Precise, in-situ endpoint detection for charged particle beam proce...
- Publication number 20030132196
- Publication date Jul 17, 2003
- Theodore R. Lundquist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sub-resolution alignment of images
- Publication number 20020199164
- Publication date Dec 26, 2002
- Madhumita Sengupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measuring back-side voltage of an integrated circuit
- Publication number 20020151091
- Publication date Oct 17, 2002
- Christopher Shaw
- G01 - MEASURING TESTING
Information Patent Application
Precise, in-situ endpoint detection for charged particle beam proce...
- Publication number 20020074494
- Publication date Jun 20, 2002
- Theodore R. Lundquist
- H01 - BASIC ELECTRIC ELEMENTS

Theodore R. Lundquist

Person

Patents Grantslast 30 patents

FIB milling of copper over organic dielectrics

Apparatus and method for optical interference fringe based integrat...

Methods and systems of performing device failure analysis, electric...

FIB based open via analysis and repair

Apparatus and method for optical interference fringe based integrat...

Apparatus and method for circuit operation definition

Apparatus and method of forming silicide in a localized manner

Sub-resolution alignment of images

Apparatus and method for detecting photon emissions from transistors

Method and system for integrated circuit backside navigation

Charged particle guide

Method and apparatus for addressing thickness variations of a trenc...

FIB milling of copper over organic dielectrics

Imaging integrated circuits with focused ion beam

Apparatus and method for detecting photon emissions from transistors

Precise, in-situ endpoint detection for charged particle beam proce...

Measuring back-side voltage of an integrated circuit

Sub-resolution alignment of images

Charged particle beam system with optical microscope

FBI etching enhanced with 1,2 di-iodo-ethane

Patents Applicationslast 30 patents

HIGH FREQUENCY LOCK-IN THERMOGRAPHY USING SINGLE PHOTON DETECTORS

Particle Beam Heating to Identify Defects

SYNCHRONIZED PULSED LADA FOR THE SIMULTANEOUS ACQUISITION OF TIMING...

FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS

SUB-RESOLUTION ALIGNMENT OF IMAGES

METHODS AND SYSTEMS OF PERFORMING DEVICE FAILURE ANALYSIS, ELECTRIC...

APPARATUS AND METHOD FOR INTEGRATED CIRCUIT DESIGN FOR CIRCUIT EDIT

APPARATUS AND METHOD FOR OPTICAL INTERFERENCE FRINGE BASED INTEGRAT...

Apparatus and method for circuit operation definition

FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS

Apparatus and method for optical interference fringe based integrat...

Apparatus and method of forming silicide in a localized manner

Method and apparatus for addressing thickness variations of a trenc...

Charged particle guide

Apparatus and method for detecting photon emissions from transistors

Precise, in-situ endpoint detection for charged particle beam proce...

FIB milling of copper over organic dielectrics

Sub-resolution alignment of images

Methods of using measured time resolved photon emission data and si...

Apparatus and method for detecting photon emissions from transistors

Method for surface preparation to enable uniform etching of polycry...

Method for surface preparation to enable uniform etching of polycry...

Method for backside die thinning and polishing of packaged integrat...

Precise, in-situ endpoint detection for charged particle beam proce...

Sub-resolution alignment of images

Measuring back-side voltage of an integrated circuit

Precise, in-situ endpoint detection for charged particle beam proce...