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Theodore W. Hilgeman
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Deer Park, NY, US
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last 30 patents
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Patent Grant
System and method for locating a source of a signal
Patent number
6,828,937
Issue date
Dec 7, 2004
Northrop Grumman Corporation
Theodore William Hilgeman
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for production of spin-polarized medical-grade...
Patent number
5,934,103
Issue date
Aug 10, 1999
Northrop Grumman Corporation
Robert E. Ryan
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Interferometer comprising translation assemblies for moving a first...
Patent number
5,825,490
Issue date
Oct 20, 1998
Northrop Grumman Corporation
Edwin G. Haas
G01 - MEASURING TESTING
Information
Patent Grant
Short path scanning interferometer
Patent number
5,781,292
Issue date
Jul 14, 1998
Northrop Grumman Corporation
Edwin G. Haas
G01 - MEASURING TESTING
Information
Patent Grant
Variable spectral resolution agile filter
Patent number
5,452,121
Issue date
Sep 19, 1995
Northrop Grumman Corporation
Theodore W. Hilgeman
G02 - OPTICS
Information
Patent Grant
Variable spatial resolution focal plane
Patent number
5,235,656
Issue date
Aug 10, 1993
Grumman Aerospace Corporation
Theodore W. Hilgeman
G02 - OPTICS
Information
Patent Grant
Infrared camouflage system
Patent number
4,609,034
Issue date
Sep 2, 1986
Grumman Aerospace Corporation
Robert Kosson
F41 - WEAPONS
Information
Patent Grant
Retroreflectance measuring apparatus
Patent number
4,097,751
Issue date
Jun 27, 1978
Grumman Aerospace Corporation
Walter G. Egan
G01 - MEASURING TESTING