Thiago DOS SANTOS GUZELLA

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Eindhoven, NL

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Patents Applicationslast 30 patents

Information Patent Application
METHOD TO PREDICT METROLOGY OFFSET OF A SEMICONDUCTOR MANUFACTURING...
- Publication number 20240094640
- Publication date Mar 21, 2024
- ASML NETHERLANDS B.V.
- Thiago DOS SANTOS GUZELLA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR IDENTIFYING CONTAMINATION IN A SEMICONDUCT...
- Publication number 20230341784
- Publication date Oct 26, 2023
- ASML NETHERLANDS B.V.
- Tijmen Pieter COLLIGNON
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONFIGURATION OF AN IMPUTER MODEL
- Publication number 20230153582
- Publication date May 18, 2023
- ASML NETHERLANDS B.V.
- Reza SAHRAEIAN
- G06 - COMPUTING CALCULATING COUNTING