Thierry Canaud

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Munchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Test arrangement for testing semiconductor circuit chips
- Patent number 7,088,122
- Issue date Aug 8, 2006
- Infineon Technologies AG
- Udo Hartmann
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Test arrangement for testing semiconductor circuit chips
- Publication number 20050068055
- Publication date Mar 31, 2005
- Udo Hartmann
- G01 - MEASURING TESTING
Information Patent Application
Integrated microcontroller module and method for checking the funct...
- Publication number 20040052149
- Publication date Mar 18, 2004
- Thomas Hanuschek
- G11 - INFORMATION STORAGE