Thierry Mesnard

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Plaisance du Touch, FR

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Patents Grantslast 30 patents

Information Patent Grant
Bias generator testing using grouped bias currents
- Patent number 12,174,253
- Issue date Dec 24, 2024
- NXP B.V.
- Cristian Pavao Moreira
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A HYBRID SUPPLY MONITORING SYSTEM FOR A RADAR DEVICE
- Publication number 20240125897
- Publication date Apr 18, 2024
- NXP B.V.
- Cristian Pavao Moreira
- G01 - MEASURING TESTING
Information Patent Application
CASCADED RADAR SYSTEM WITH IMPROVED AVAILABILITY
- Publication number 20240077578
- Publication date Mar 7, 2024
- NXP B.V.
- Cristian Pavao Moreira
- G01 - MEASURING TESTING
Information Patent Application
BIAS GENERATOR TESTING USING GROUPED BIAS CURRENTS
- Publication number 20230333161
- Publication date Oct 19, 2023
- NXP B.V.
- Cristian Pavao Moreira
- G01 - MEASURING TESTING