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Thierry Oggier
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Depth sensing using a sparse array of pulsed beams
Patent number
12,117,286
Issue date
Oct 15, 2024
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-flight depth mapping with parallax compensation
Patent number
11,681,027
Issue date
Jun 20, 2023
Apple Inc.
Cristiano L Niclass
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Selection of pulse repetition intervals for sensing time of flight
Patent number
11,500,094
Issue date
Nov 15, 2022
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
Calibration of depth sensing using a sparse array of pulsed beams
Patent number
11,371,833
Issue date
Jun 28, 2022
Apple Inc.
Zeev Roth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Depth sensor combining line triangulation and time of flight
Patent number
10,955,555
Issue date
Mar 23, 2021
Apple Inc.
Thierry Oggier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Calibration of depth sensing using a sparse array of pulsed beams
Patent number
10,955,234
Issue date
Mar 23, 2021
Apple Inc.
Zeev Roth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight depth mapping with parallax compensation
Patent number
10,830,879
Issue date
Nov 10, 2020
Apple Inc.
Cristiano L Niclass
G01 - MEASURING TESTING
Information
Patent Grant
SPAD detector having modulated sensitivity
Patent number
10,801,886
Issue date
Oct 13, 2020
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Grant
Imaging system with synchronized scan and sensing
Patent number
10,795,001
Issue date
Oct 6, 2020
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Grant
Line scan depth sensor comparing a time dependent waveform of the s...
Patent number
10,436,910
Issue date
Oct 8, 2019
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
Light detection and ranging sensor
Patent number
10,324,171
Issue date
Jun 18, 2019
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Calibration of depth sensing using a sparse array of pulsed beams
Publication number
20210164776
Publication date
Jun 3, 2021
Apple Inc.
Zeev Roth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Depth sensor with interlaced sampling structure
Publication number
20210055419
Publication date
Feb 25, 2021
Apple Inc.
Thierry Oggier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Time-of-flight depth mapping with parallax compensation
Publication number
20210003680
Publication date
Jan 7, 2021
Apple Inc.
Cristiano L. Niclass
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Selection of pulse repetition intervals for sensing time of flight
Publication number
20200386890
Publication date
Dec 10, 2020
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Application
Depth sensing using a sparse array of pulsed beams
Publication number
20200256993
Publication date
Aug 13, 2020
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Application
Calibration of depth sensing using a sparse array of pulsed beams
Publication number
20200256669
Publication date
Aug 13, 2020
Apple Inc.
Zeev Roth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Imaging system with synchronized scan and sensing
Publication number
20200158831
Publication date
May 21, 2020
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Application
Line scan depth sensor
Publication number
20190361127
Publication date
Nov 28, 2019
Apple Inc.
Thierry Oggier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Time-of-flight depth mapping with parallax compensation
Publication number
20190004156
Publication date
Jan 3, 2019
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Application
Multi-range time of flight sensing
Publication number
20180341009
Publication date
Nov 29, 2018
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Application
SPAD Detector Having Modulated Sensitivity
Publication number
20180209846
Publication date
Jul 26, 2018
Apple Inc.
Shingo Mandai
G01 - MEASURING TESTING
Information
Patent Application
LiDAR with irregular pulse sequence
Publication number
20180081041
Publication date
Mar 22, 2018
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING
Information
Patent Application
Line scan depth sensor
Publication number
20180081062
Publication date
Mar 22, 2018
Apple Inc.
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Application
Light detection and ranging sensor
Publication number
20170176579
Publication date
Jun 22, 2017
Apple Inc.
Cristiano L. Niclass
G01 - MEASURING TESTING