Thierry Parrassin

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Grenoble, FR

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Patents Grantslast 30 patents

Information Patent Grant
Spectral mapping of photo emission
- Patent number 9,903,824
- Issue date Feb 27, 2018
- FEI EFA, Inc.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection by thermal frequency imaging
- Patent number 9,000,790
- Issue date Apr 7, 2015
- STMicroelectronics S.A.
- Guillaume Celi
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam treatment method and semiconductor device suitable...
- Patent number 7,026,198
- Issue date Apr 11, 2006
- STMicroelectronics S.A.
- Thierry Parrassin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SPECTRAL MAPPING OF PHOTO EMISSION
- Publication number 20150293037
- Publication date Oct 15, 2015
- DCG SYSTEMS, INC.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Application
Defect Detection by Thermal Frequency Imaging
- Publication number 20130002283
- Publication date Jan 3, 2013
- STMicroelectronics S.A.
- Guillaume Celi
- G01 - MEASURING TESTING
Information Patent Application
Test structure for integrated electronic circuits
- Publication number 20060157699
- Publication date Jul 20, 2006
- STMicroelectronics S.A.
- Michel Vallet
- G02 - OPTICS
Information Patent Application
Focused ion beam treatment method and semiconductor device suitable...
- Publication number 20040266072
- Publication date Dec 30, 2004
- STMicroelectronics S.A.
- Thierry Parrassin
- H01 - BASIC ELECTRIC ELEMENTS