Thijs Boehme

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Kessel-Lo, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for producing a probe suitable for scanning probe microscopy
- Patent number 11,035,880
- Issue date Jun 15, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Producing a Probe Suitable for Scanning Probe Microscopy
- Publication number 20200278379
- Publication date Sep 3, 2020
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING