Thiloma I. Perera

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Characterization of semiconductor resist material during processing
- Patent number 4,874,240
- Issue date Oct 17, 1989
- Hoechst Celanese
- Michael P. C. Watts
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Absorption measurements of materials
- Patent number 4,857,738
- Issue date Aug 15, 1989
- General Signal Corporation
- David W. Myers
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY