Thirumalai Sridhar

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Scan test circuits for use with multiple frequency circuits
- Patent number 5,488,613
- Issue date Jan 30, 1996
- Texas Instruments Incorporated
- Thirumalai Sridhar
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing passive substrates for integrated...
- Patent number 5,059,897
- Issue date Oct 22, 1991
- Texas Instruments Incorporated
- Thomas J. Aton
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing very large scale integrated memory...
- Patent number 4,601,034
- Issue date Jul 15, 1986
- Texas Instruments Incorporated
- Thirumalai Sridhar
- G11 - INFORMATION STORAGE
Information Patent Grant
Architecture and method for testing VLSI processors
- Patent number 4,597,080
- Issue date Jun 24, 1986
- Texas Instruments Incorporated
- Satish M. Thatte
- G01 - MEASURING TESTING