Thomas A. Bauer

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
IC chip uniform delayering methods
- Patent number 7,504,337
- Issue date Mar 17, 2009
- International Business Machines Corporation
- Keith E. Barton
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscopy sample preparation method for elec...
- Patent number 7,214,935
- Issue date May 8, 2007
- International Business Machines Corporation
- Thomas A. Bauer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IC CHIP UNIFORM DELAYERING METHODS
- Publication number 20080233751
- Publication date Sep 25, 2008
- Keith E. Barton
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPY SAMPLE PREPARATION METHOD FOR ELEC...
- Publication number 20060065830
- Publication date Mar 30, 2006
- International Business Machines Corporation
- Thomas A. Bauer
- G01 - MEASURING TESTING