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Thomas A. Hanson
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Corning, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Method of identifying wideband MMF from 850 nm DMD measurements
Patent number
11,249,249
Issue date
Feb 15, 2022
Corning Incorporated
John Steele Abbott
G01 - MEASURING TESTING
Information
Patent Grant
Methods for reducing noise in an electrical signal
Patent number
5,652,715
Issue date
Jul 29, 1997
Thomas A. Hanson
G01 - MEASURING TESTING
Information
Patent Grant
Optical waveguide spectral attenuation using an OTDR
Patent number
5,534,994
Issue date
Jul 9, 1996
Corning Incorporated
Thomas A. Hanson
G01 - MEASURING TESTING
Information
Patent Grant
Methods for determining optical properties of optical waveguide fib...
Patent number
5,479,251
Issue date
Dec 26, 1995
Corning Incorporated
Thomas A. Hanson
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for determining cleave end angle of an optical...
Patent number
5,140,167
Issue date
Aug 18, 1992
Photon Kinetics, Inc.
Casey S. Shaar
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD OF IDENTIFYING WIDEBAND MMF FROM 850 NM DMD MEASUREMENTS
Publication number
20190383999
Publication date
Dec 19, 2019
Corning Incorporated
John Steele Abbott III
G01 - MEASURING TESTING