Thomas Baumann

Person

Anzing, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit arrangement with a plurality of on-chip monitor circuits an...
- Patent number 9,041,422
- Issue date May 26, 2015
- Intel Mobile Communications GmbH
- Thomas Baumann
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with a test circuit and a reference circuit
- Patent number 8,847,604
- Issue date Sep 30, 2014
- Infineon Technologies AG
- Thomas Baumann
- G01 - MEASURING TESTING
Information Patent Grant
Circuit arrangement and method for operating a circuit arrangement
- Patent number 8,710,913
- Issue date Apr 29, 2014
- Intel Mobile Communications GmbH
- Thomas Baumann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-chip self calibrating delay monitoring circuitry
- Patent number 8,451,043
- Issue date May 28, 2013
- Intel Mobile Communications GmbH
- Thomas Baumann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-chip self calibrating delay monitoring circuitry
- Patent number 8,228,106
- Issue date Jul 24, 2012
- Intel Mobile Communications GmbH
- Thomas Baumann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit arrangement with a test circuit and a reference circuit and...
- Patent number 8,081,003
- Issue date Dec 20, 2011
- Infineon Technologies AG
- Christian Pacha
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT ARRANGEMENT AND METHOD FOR OPERATING A CIRCUIT ARRANGEMENT
- Publication number 20130293281
- Publication date Nov 7, 2013
- Intel Mobile Communications GmbH
- Thomas Baumann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
On-Chip Self Calibrating Delay Monitoring Circuitry
- Publication number 20120268184
- Publication date Oct 25, 2012
- Intel Mobile Communications GmbH
- Thomas Baumann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
On-Chip Self Calibrating Delay Monitoring Circuitry
- Publication number 20120262213
- Publication date Oct 18, 2012
- Intel Mobile Communications GmbH
- Thomas Baumann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuit Arrangement with a Plurality of On-Chip Monitor Circuits an...
- Publication number 20120249170
- Publication date Oct 4, 2012
- INFINEON TECHNOLOGIES AG
- Thomas Baumann
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device With A Test Circuit And A Reference Circuit
- Publication number 20120062257
- Publication date Mar 15, 2012
- Thomas BAUMANN
- G01 - MEASURING TESTING
Information Patent Application
On-Chip Self Calibrating Delay Monitoring Circuitry
- Publication number 20110187433
- Publication date Aug 4, 2011
- INFINEON TECHNOLOGIES AG
- Thomas Baumann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuit Arrangement With A Test Circuit And A Reference Circuit And...
- Publication number 20100194400
- Publication date Aug 5, 2010
- Thomas BAUMANN
- G01 - MEASURING TESTING

Thomas Baumann

Person

Patents Grantslast 30 patents

Circuit arrangement with a plurality of on-chip monitor circuits an...

Semiconductor device with a test circuit and a reference circuit

Circuit arrangement and method for operating a circuit arrangement

On-chip self calibrating delay monitoring circuitry

On-chip self calibrating delay monitoring circuitry

Circuit arrangement with a test circuit and a reference circuit and...

Patents Applicationslast 30 patents

CIRCUIT ARRANGEMENT AND METHOD FOR OPERATING A CIRCUIT ARRANGEMENT

On-Chip Self Calibrating Delay Monitoring Circuitry

On-Chip Self Calibrating Delay Monitoring Circuitry

Circuit Arrangement with a Plurality of On-Chip Monitor Circuits an...

Semiconductor Device With A Test Circuit And A Reference Circuit

On-Chip Self Calibrating Delay Monitoring Circuitry

Circuit Arrangement With A Test Circuit And A Reference Circuit And...