Thomas Bayer

Person

Boeblingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle-optical systems, methods and components
- Patent number 8,039,813
- Issue date Oct 18, 2011
- Carl Zeiss SMT GmbH
- Antonio Casares
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe arrangement
- Patent number 6,356,089
- Issue date Mar 12, 2002
- International Business Machines Corporation
- Thomas Bayer
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing a calibration standard for 2-D and 3-D profilom...
- Patent number 6,218,264
- Issue date Apr 17, 2001
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micromechanical sensor for AFM/STM profilometry
- Patent number 6,091,124
- Issue date Jul 18, 2000
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micro-mechanically fabricated read/write head with a strengthening...
- Patent number 6,088,320
- Issue date Jul 11, 2000
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for profilometers and manufacturing procedure
- Patent number 6,028,008
- Issue date Feb 22, 2000
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,960,255
- Issue date Sep 28, 1999
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Manufacturing method for membrane lithography mask with mask fields
- Patent number 5,935,739
- Issue date Aug 10, 1999
- International Business Machines Corporation
- Thomas Bayer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process for the creation of a thermal SiO.sub.2 layer with extremel...
- Patent number 5,817,581
- Issue date Oct 6, 1998
- International Business Machines Corporation
- Thomas Bayer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resonant sensor for determining multiple physical values
- Patent number 5,789,666
- Issue date Aug 4, 1998
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,665,905
- Issue date Sep 9, 1997
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Force microscope and method for measuring atomic forces in multiple...
- Patent number 5,646,339
- Issue date Jul 8, 1997
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standards for profilometers and methods of producing them
- Patent number 5,578,745
- Issue date Nov 26, 1996
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,534,359
- Issue date Jul 9, 1996
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micromechanical sensor and sensor fabrication process
- Patent number 5,455,419
- Issue date Oct 3, 1995
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ultrafine silicon tips for AFM/STM profilometry
- Patent number 5,382,795
- Issue date Jan 17, 1995
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for plasma or reactive ion etching and method of etching...
- Patent number 5,304,278
- Issue date Apr 19, 1994
- International Business Machines Corporation
- Johann Bartha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of etching substrates having a low thermal conductivity
- Patent number 5,296,091
- Issue date Mar 22, 1994
- International Business Machines Corporation
- Johann Bartha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modular multilayer interwiring structure
- Patent number 5,283,107
- Issue date Feb 1, 1994
- International Business Machines Corporation
- Thomas Bayer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micromechanical sensor fabrication process
- Patent number 5,282,924
- Issue date Feb 1, 1994
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of producing ultrafine silicon tips for the AFM/STM profilom...
- Patent number 5,242,541
- Issue date Sep 7, 1993
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Process for fabricating silicon carbide films with a predetermined...
- Patent number 5,162,133
- Issue date Nov 10, 1992
- International Business Machines Corporation
- Johann W. Bartha
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of producing micromechanical sensors for the AFM/STM profilo...
- Patent number 5,116,462
- Issue date May 26, 1992
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of producing micromechanical sensors for the AFM/STM profilo...
- Patent number 5,051,379
- Issue date Sep 24, 1991
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
PECVD (plasma enhanced chemical vapor deposition) method for deposi...
- Patent number 4,969,415
- Issue date Nov 13, 1990
- International Business Machines Corporation
- Johann W. Bartha
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
PECVD (plasma enhanced chemical vapor deposition) method for deposi...
- Patent number 4,918,033
- Issue date Apr 17, 1990
- International Business Machines Corporation
- Johann W. Bartha
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Process for fabricating arbitrarily shaped through holes in a compo...
- Patent number 4,871,418
- Issue date Oct 3, 1989
- International Business Machines Corporation
- Jurgen Wittlinger
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Grant
Contact probe arrangement for electrically connecting a test system...
- Patent number 4,843,315
- Issue date Jun 27, 1989
- International Business Machines Corporation
- Thomas Bayer
- G01 - MEASURING TESTING
Information Patent Grant
Composite magnetic disk with Si and SiC substrate
- Patent number 4,598,017
- Issue date Jul 1, 1986
- International Business Machines Corporation
- Thomas Bayer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for the selective, self-aligned deposition of...
- Patent number 4,569,743
- Issue date Feb 11, 1986
- International Business Machines Corporation
- Thomas Bayer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
Particle-Optical Component
- Publication number 20090114818
- Publication date May 7, 2009
- Carl Zeiss SMT AG
- Antonio Casares
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT PROBE ARRANGEMENT
- Publication number 20010011896
- Publication date Aug 9, 2001
- THOMAS BAYER
- G01 - MEASURING TESTING

Thomas Bayer

Person

Patents Grantslast 30 patents

Charged particle-optical systems, methods and components

Contact probe arrangement

Method of producing a calibration standard for 2-D and 3-D profilom...

Micromechanical sensor for AFM/STM profilometry

Micro-mechanically fabricated read/write head with a strengthening...

Calibration standard for profilometers and manufacturing procedure

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Manufacturing method for membrane lithography mask with mask fields

Process for the creation of a thermal SiO.sub.2 layer with extremel...

Resonant sensor for determining multiple physical values

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Force microscope and method for measuring atomic forces in multiple...

Calibration standards for profilometers and methods of producing them

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Micromechanical sensor and sensor fabrication process

Ultrafine silicon tips for AFM/STM profilometry

Apparatus for plasma or reactive ion etching and method of etching...

Method of etching substrates having a low thermal conductivity

Modular multilayer interwiring structure

Micromechanical sensor fabrication process

Method of producing ultrafine silicon tips for the AFM/STM profilom...

Process for fabricating silicon carbide films with a predetermined...

Method of producing micromechanical sensors for the AFM/STM profilo...

Method of producing micromechanical sensors for the AFM/STM profilo...

PECVD (plasma enhanced chemical vapor deposition) method for deposi...

PECVD (plasma enhanced chemical vapor deposition) method for deposi...

Process for fabricating arbitrarily shaped through holes in a compo...

Contact probe arrangement for electrically connecting a test system...

Composite magnetic disk with Si and SiC substrate

Method and apparatus for the selective, self-aligned deposition of...

Patents Applicationslast 30 patents

Particle-Optical Component

CONTACT PROBE ARRANGEMENT