Thomas Boehler

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Ottobrunn, DE

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Patents Grantslast 30 patents

Information Patent Grant
Modular test controller with BIST circuit for testing embedded DRAM...
- Patent number 7,356,741
- Issue date Apr 8, 2008
- Infineon Technologies AG
- Thomas Boehler
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for testing embedded DRAM circuits through direc...
- Patent number 7,171,596
- Issue date Jan 30, 2007
- Infineon Technologies AG
- Thomas Boehler
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self test system and method
- Patent number 7,159,145
- Issue date Jan 2, 2007
- Infineon Technologies AG
- Li Wang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Built-in self test system and method
- Publication number 20040230870
- Publication date Nov 18, 2004
- Li Wang
- G11 - INFORMATION STORAGE
Information Patent Application
Modular test controller with BISTcircuit for testing embedded DRAM...
- Publication number 20040103356
- Publication date May 27, 2004
- Infineon Technologies North America Corp.
- Thomas Boehler
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit and method for testing embedded DRAM circuits through direc...
- Publication number 20040049720
- Publication date Mar 11, 2004
- Infineon Technologies North America Corp.
- Thomas Boehler
- G11 - INFORMATION STORAGE