Thomas C. Carrington

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Plano, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for inspection using off-angle lighting
- Patent number 7,024,031
- Issue date Apr 4, 2006
- August Technology Corp.
- Ramiro Castellanos-Nolasco
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting bumped wafers
- Patent number 6,765,666
- Issue date Jul 20, 2004
- Semiconductor Technologies & Instruments, Inc.
- Clyde Maxwell Guest
- G01 - MEASURING TESTING