Thomas D. Coe

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Boxford, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Hyperboloid electrical contact
- Patent number 7,775,841
- Issue date Aug 17, 2010
- QA Technology Company, Inc.
- Thomas D. Coe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a hyperboloid electrical contact
- Patent number 7,191,518
- Issue date Mar 20, 2007
- QA Technology Company, Inc.
- Victor Beloritsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test probe and connector
- Patent number 6,876,530
- Issue date Apr 5, 2005
- QA Technology Company, Inc.
- Matthew R. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Hyperboloid electrical contact
- Patent number 6,767,260
- Issue date Jul 27, 2004
- QA Technology Company, Inc.
- Victor Beloritsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical circuit test probe having an elongate cylindrical retain...
- Patent number 4,885,533
- Issue date Dec 5, 1989
- Q A Technology Company, Inc.
- Thomas D. Coe
- G01 - MEASURING TESTING
Information Patent Grant
Electrical circuit test probe and connector
- Patent number 4,659,987
- Issue date Apr 21, 1987
- Q.A. Technology Company
- Thomas D. Coe
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connector for electrical circuit test probe and connector
- Patent number 4,597,622
- Issue date Jul 1, 1986
- Q.A. Technology Company
- Thomas D. Coe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HYPERBOLOID ELECTRICAL CONTACT
- Publication number 20090061700
- Publication date Mar 5, 2009
- QA TECHNOLOGY COMPANY, INC.
- Thomas D. Coe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hyperboloid electrical contact
- Publication number 20040237301
- Publication date Dec 2, 2004
- QA TECHNOLOGY COMPANY, INC.
- Victor Beloritsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hyperboloid electrical contact
- Publication number 20030162447
- Publication date Aug 28, 2003
- QA TECHNOLOGY COMPANY, INC.
- Victor Beloritsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test probe and connector
- Publication number 20020093355
- Publication date Jul 18, 2002
- Matthew R. Parker
- G01 - MEASURING TESTING