Thomas E. Lillibridge

Person

Plano, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electrical test structure and method for monitoring deep trench imp...
- Patent number 11,119,137
- Issue date Sep 14, 2021
- Texas Instruments Incorporated
- Thomas Edward Lillibridge
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Apparatus with overlapping deep trench and shallow trench and metho...
- Patent number 10,879,106
- Issue date Dec 29, 2020
- Texas Instruments Incorporated
- Thomas Edward Lillibridge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate contact having substantially straight sidewalls to a top...
- Patent number 9,793,364
- Issue date Oct 17, 2017
- Texas Instruments Incorporated
- David William Hamann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate contact etch process
- Patent number 9,460,962
- Issue date Oct 4, 2016
- Texas Instruments Incorporated
- David William Hamann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating metal-bearing integrated circuit structures h...
- Patent number 8,258,041
- Issue date Sep 4, 2012
- Texas Instruments Incorporated
- Srinivas Raghavan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BIRD'S BEAK PROFILE OF FIELD OXIDE REGION
- Publication number 20230253495
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Jingjing Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL TEST STRUCTURE AND METHOD FOR MONITORING DEEP TRENCH IMP...
- Publication number 20210208187
- Publication date Jul 8, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Thomas Edward Lillibridge
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
APPARATUS WITH OVERLAPPING DEEP TRENCH AND SHALLOW TRENCH AND METHO...
- Publication number 20210090941
- Publication date Mar 25, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Thomas Edward Lillibridge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS WITH OVERLAPPING DEEP TRENCH AND SHALLOW TRENCH AND METHO...
- Publication number 20190259651
- Publication date Aug 22, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Thomas Edward Lillibridge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL SUBSTRATE CONTACT ETCH PROCESS
- Publication number 20170040426
- Publication date Feb 9, 2017
- TEXAS INSTRUMENTS INCORPORATED
- David William Hamann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING METAL-BEARING INTEGRATED CIRCUIT STRUCTURES H...
- Publication number 20110306207
- Publication date Dec 15, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Srinivas Raghavan
- H01 - BASIC ELECTRIC ELEMENTS

Thomas E. Lillibridge

Person

Patents Grantslast 30 patents

Electrical test structure and method for monitoring deep trench imp...

Apparatus with overlapping deep trench and shallow trench and metho...

Substrate contact having substantially straight sidewalls to a top...

Substrate contact etch process

Method of fabricating metal-bearing integrated circuit structures h...

Patents Applicationslast 30 patents

BIRD'S BEAK PROFILE OF FIELD OXIDE REGION

ELECTRICAL TEST STRUCTURE AND METHOD FOR MONITORING DEEP TRENCH IMP...

APPARATUS WITH OVERLAPPING DEEP TRENCH AND SHALLOW TRENCH AND METHO...

APPARATUS WITH OVERLAPPING DEEP TRENCH AND SHALLOW TRENCH AND METHO...

NOVEL SUBSTRATE CONTACT ETCH PROCESS

METHOD OF FABRICATING METAL-BEARING INTEGRATED CIRCUIT STRUCTURES H...