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Thomas E. Love
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Gainesville, VA, US
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last 30 patents
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Patent Grant
Devices and methods for stacking individually tested devices to for...
Patent number
8,697,457
Issue date
Apr 15, 2014
BAE Systems Information and Electronic Systems Integration Inc.
Keith K. Sturcken
G01 - MEASURING TESTING
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Patent Grant
System and method for multi-chip module die extraction and replacement
Patent number
8,338,230
Issue date
Dec 25, 2012
BAE Systems Information and Electronic Systems Integration Inc.
John A. Hughes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for multi-chip module die extraction and replacement
Patent number
8,067,829
Issue date
Nov 29, 2011
BAE Systems Information and Electronic Systems Integration Inc.
John A. Hughes
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
DEVICES AND METHODS FOR STACKING INDIVIDUALLY TESTED DEVICES TO FOR...
Publication number
20140175675
Publication date
Jun 26, 2014
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
Keith K. Sturcken
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MULTI-CHIP MODULE DIE EXTRACTION AND REPLACEMENT
Publication number
20120015480
Publication date
Jan 19, 2012
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
John A. Hughes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR MULTI-CHIP MODULE DIE EXTRACTION AND REPLACEMENT
Publication number
20100276794
Publication date
Nov 4, 2010
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
John A. Hughes
H01 - BASIC ELECTRIC ELEMENTS