Thomas E. Nohava

Person

Apple Valley, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Preventing stray currents in sensors in conductive media
- Patent number 9,140,662
- Issue date Sep 22, 2015
- Honeywell International Inc.
- Robert Jon Carlson
- G01 - MEASURING TESTING
Information Patent Grant
Dual wavelength detector
- Patent number 7,329,895
- Issue date Feb 12, 2008
- Honeywell International Inc.
- Barrett E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Method for growing single crystal GaN on silicon
- Patent number 6,818,061
- Issue date Nov 16, 2004
- Honeywell International, Inc.
- Andrzej Peczalski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Back-illuminated heterojunction photodiode
- Patent number 6,483,130
- Issue date Nov 19, 2002
- Honeywell International Inc.
- Wei X. Yang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
High gain GaN/AlGaN heterojunction phototransistor
- Patent number 6,137,123
- Issue date Oct 24, 2000
- Honeywell International Inc.
- Wei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
GaAs heterostructure metal-insulator-semiconductor integrated circu...
- Patent number 5,124,762
- Issue date Jun 23, 1992
- Honeywell Inc.
- Timothy T. Childs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Encapsulant of CdTe boules for multiblade wafering
- Patent number 4,564,494
- Issue date Jan 14, 1986
- Honeywell Inc.
- Thomas E. Nohava
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Encapsulated CDTe boules for multiblade wafering
- Patent number 4,490,441
- Issue date Dec 25, 1984
- Honeywell Inc.
- Thomas E. Nohava
- B28 - WORKING CEMENT, CLAY, OR STONE

Patents Applicationslast 30 patents

Information Patent Application
Method for growing single crystal GaN on silicon
- Publication number 20040200406
- Publication date Oct 14, 2004
- Andrzej Peczalski
- C30 - CRYSTAL GROWTH
Information Patent Application
Dual wavelength detector
- Publication number 20030160231
- Publication date Aug 28, 2003
- Barrett E. Cole
- G01 - MEASURING TESTING

Thomas E. Nohava

Person

Patents Grantslast 30 patents

Preventing stray currents in sensors in conductive media

Dual wavelength detector

Method for growing single crystal GaN on silicon

Back-illuminated heterojunction photodiode

High gain GaN/AlGaN heterojunction phototransistor

GaAs heterostructure metal-insulator-semiconductor integrated circu...

Encapsulant of CdTe boules for multiblade wafering

Encapsulated CDTe boules for multiblade wafering

Patents Applicationslast 30 patents

Method for growing single crystal GaN on silicon

Dual wavelength detector