Thomas E. Obremski

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So. Burlington, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing embedded DRAM arrays
- Patent number 7,237,165
- Issue date Jun 26, 2007
- International Business Machines Corporation
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing logic and embedded memory in parallel
- Patent number 7,103,814
- Issue date Sep 5, 2006
- International Business Machines Corporation
- William R. Corbin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing embedded DRAM arrays
- Patent number 7,073,100
- Issue date Jul 4, 2006
- International Business Machines Corporation
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable built-in self test (BIST) data generator for semicondu...
- Patent number 6,452,848
- Issue date Sep 17, 2002
- International Business Machines Corporation
- Thomas E. Obremski
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for ram built-in self test (BIST) address gene...
- Patent number 6,388,930
- Issue date May 14, 2002
- International Business Machines Corporation
- Thomas E. Obremski
- G11 - INFORMATION STORAGE
Information Patent Grant
Partitioned dynamic memory allowing substitution of a redundant cir...
- Patent number 5,724,295
- Issue date Mar 3, 1998
- International Business Machines Corporation
- Mark Adam Beiley
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method for testing embedded DRAM arrays
- Publication number 20050088888
- Publication date Apr 28, 2005
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing embedded DRAM arrays
- Publication number 20040093539
- Publication date May 13, 2004
- International Business Machines Corporation
- Laura S. Chadwick
- G11 - INFORMATION STORAGE
Information Patent Application
Testing logic and embedded memory in parallel
- Publication number 20040083412
- Publication date Apr 29, 2004
- International Business Machines Corporation
- William R. Corbin
- G01 - MEASURING TESTING