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Thomas Edwin Sandwick
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Hopewell Junction, NY, US
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last 30 patents
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Patent Grant
Method and apparatus for in-line oxide thickness determination in c...
Patent number
6,020,264
Issue date
Feb 1, 2000
International Business Machines Corporation
Naftali Eliahu Lustig
B24 - GRINDING POLISHING
Information
Patent Grant
Method of planarizing semiconductor wafers
Patent number
5,935,869
Issue date
Aug 10, 1999
International Business Machines Corporation
Cuc Huynh
C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information
Patent Grant
Vertical polishing tool and method
Patent number
5,897,425
Issue date
Apr 27, 1999
International Business Machines Corporation
Thomas Robert Fisher
B24 - GRINDING POLISHING
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Patent Grant
Assembly and method for making in process thin film thickness measu...
Patent number
5,640,242
Issue date
Jun 17, 1997
International Business Machines Corporation
Martin Patrick O'Boyle
G01 - MEASURING TESTING
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Patent Grant
Refractory metal capped low resistivity metal conductor lines and vias
Patent number
5,262,354
Issue date
Nov 16, 1993
International Business Machines Corporation
William J. Cote
H01 - BASIC ELECTRIC ELEMENTS