Thomas G. Schmelzer

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Cranberry Township, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Specimen holder used for mounting samples in electron microscopes
- Patent number RE48201
- Issue date Sep 8, 2020
- PROTOCHIPS, INC.
- David P. Nackashi
Information Patent Grant
Specimen holder used for mounting samples in electron microscopes
- Patent number 9,312,097
- Issue date Apr 12, 2016
- PROTOCHIPS, INC.
- David P. Nackashi
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder used for mounting samples in electron microscopes
- Patent number 8,859,991
- Issue date Oct 14, 2014
- Protochips, Inc.
- David P. Nackashi
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder used for mounting samples in electron microscopes
- Patent number 8,853,646
- Issue date Oct 7, 2014
- Protochips, Inc.
- David P. Nackashi
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder used for mounting
- Patent number 8,513,621
- Issue date Aug 20, 2013
- Protochips, Inc.
- David P. Nackashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES
- Publication number 20150129778
- Publication date May 14, 2015
- PROTOCHIPS, INC.
- David P. Nackashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES
- Publication number 20130206984
- Publication date Aug 15, 2013
- PROTOCHIPS, INC.
- David P. Nackashi
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES
- Publication number 20130146784
- Publication date Jun 13, 2013
- PROTOCHIPS, INC.
- David P. Nackashi
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN HOLDER USED FOR MOUNTING
- Publication number 20110127427
- Publication date Jun 2, 2011
- PROTOCHIPS, INC.
- David P. Nackashi
- G01 - MEASURING TESTING