Thomas Gentner

Person

Boeblingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Testing a single chip in a wafer probing system
- Patent number 11,808,808
- Issue date Nov 7, 2023
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Grant
Logic built-in self-test of an electronic circuit
- Patent number 11,574,695
- Issue date Feb 7, 2023
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit with optical tunnel
- Patent number 11,239,152
- Issue date Feb 1, 2022
- International Business Machines Corporation
- Otto Andreas Torreiter
- G01 - MEASURING TESTING
Information Patent Grant
Continuous mutual extended processor self-test
- Patent number 11,074,147
- Issue date Jul 27, 2021
- International Business Machines Corporation
- Tobias Ulrich Bergmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ATE compatible high-efficient functional test
- Patent number 10,768,232
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Thomas Gentner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Constrained pseudorandom test pattern for in-system logic built-in...
- Patent number 10,746,790
- Issue date Aug 18, 2020
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G01 - MEASURING TESTING
Information Patent Grant
Functional testing of high-speed serial links
- Patent number 10,684,930
- Issue date Jun 16, 2020
- International Business Machines Corporation
- Martin Eckert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip hardware-controlled window strobing
- Patent number 10,288,684
- Issue date May 14, 2019
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Grant
On-chip hardware-controlled window strobing
- Patent number 10,281,527
- Issue date May 7, 2019
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Grant
Layout effect characterization for integrated circuits
- Patent number 10,114,914
- Issue date Oct 30, 2018
- International Business Machines Corporation
- Martin Eckert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Layout effect characterization for integrated circuits
- Patent number 9,904,748
- Issue date Feb 27, 2018
- International Business Machines Corporation
- Martin Eckert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Layout effect characterization for integrated circuits
- Patent number 9,740,813
- Issue date Aug 22, 2017
- International Business Machines Corporation
- Martin Eckert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing an integrated circuit
- Patent number 9,354,275
- Issue date May 31, 2016
- GLOBALFOUNDRIES Inc.
- Birol Akdemir
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit failure prediction using clock duty cycle record...
- Patent number 9,319,030
- Issue date Apr 19, 2016
- International Business Machines Corporation
- Thomas Gentner
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM
- Publication number 20240019488
- Publication date Jan 18, 2024
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM
- Publication number 20230176116
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
LOGIC BUILT-IN SELF-TEST OF AN ELECTRONIC CIRCUIT
- Publication number 20230035157
- Publication date Feb 2, 2023
- International Business Machines Corporation
- Alejandro Alberto Cook Lobo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT WITH OPTICAL TUNNEL
- Publication number 20210066183
- Publication date Mar 4, 2021
- International Business Machines Corporation
- Otto Andreas Torreiter
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS MUTUAL EXTENDED PROCESSOR SELF-TEST
- Publication number 20200174901
- Publication date Jun 4, 2020
- International Business Machines Corporation
- Tobias Ulrich Bergmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUNCTIONAL TESTING OF HIGH-SPEED SERIAL LINKS
- Publication number 20190163596
- Publication date May 30, 2019
- International Business Machines Corporation
- Martin Eckert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ATE COMPATIBLE HIGH-EFFICIENT FUNCTIONAL TEST
- Publication number 20190018061
- Publication date Jan 17, 2019
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP HARDWARE-CONTROLLED WINDOW STROBING
- Publication number 20180364309
- Publication date Dec 20, 2018
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP HARDWARE-CONTROLLED WINDOW STROBING
- Publication number 20180364308
- Publication date Dec 20, 2018
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
LAYOUT EFFECT CHARACTERIZATION FOR INTEGRATED CIRCUITS
- Publication number 20180107771
- Publication date Apr 19, 2018
- International Business Machines Corporation
- Martin Eckert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT FAILURE PREDICTION USING CLOCK DUTY CYCLE RECORD...
- Publication number 20150171835
- Publication date Jun 18, 2015
- International Business Machines Corporation
- Thomas Gentner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING AN INTEGRATED CIRCUIT
- Publication number 20140351664
- Publication date Nov 27, 2014
- International Business Machines Corporation
- Birol Akdemir
- G01 - MEASURING TESTING

Thomas Gentner

Person

Patents Grantslast 30 patents

Testing a single chip in a wafer probing system

Logic built-in self-test of an electronic circuit

Integrated circuit with optical tunnel

Continuous mutual extended processor self-test

ATE compatible high-efficient functional test

Constrained pseudorandom test pattern for in-system logic built-in...

Functional testing of high-speed serial links

On-chip hardware-controlled window strobing

On-chip hardware-controlled window strobing

Layout effect characterization for integrated circuits

Layout effect characterization for integrated circuits

Layout effect characterization for integrated circuits

Testing an integrated circuit

Integrated circuit failure prediction using clock duty cycle record...

Patents Applicationslast 30 patents

TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM

TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM

LOGIC BUILT-IN SELF-TEST OF AN ELECTRONIC CIRCUIT

INTEGRATED CIRCUIT WITH OPTICAL TUNNEL

CONTINUOUS MUTUAL EXTENDED PROCESSOR SELF-TEST

FUNCTIONAL TESTING OF HIGH-SPEED SERIAL LINKS

ATE COMPATIBLE HIGH-EFFICIENT FUNCTIONAL TEST

ON-CHIP HARDWARE-CONTROLLED WINDOW STROBING

ON-CHIP HARDWARE-CONTROLLED WINDOW STROBING

LAYOUT EFFECT CHARACTERIZATION FOR INTEGRATED CIRCUITS

INTEGRATED CIRCUIT FAILURE PREDICTION USING CLOCK DUTY CYCLE RECORD...

TESTING AN INTEGRATED CIRCUIT