Thomas Grebner

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Freising, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for carrying out a process on an integrated circuit
- Patent number 7,870,447
- Issue date Jan 11, 2011
- Qimonda AG
- Thomas Grebner
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing wafers to be tested and calibration apparatus
- Patent number 6,897,646
- Issue date May 24, 2005
- Infineon Technologies AG
- Thomas Grebner
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component, tester device and method for calibrating a te...
- Patent number 6,882,139
- Issue date Apr 19, 2005
- Infineon Technologies AG
- Thomas Grebner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for carrying out a process on an integrated circuit
- Publication number 20060123399
- Publication date Jun 8, 2006
- Infineon Technologies AG
- Thomas Grebner
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing wafers to be tested and calibration apparatus
- Publication number 20030076126
- Publication date Apr 24, 2003
- Thomas Grebner
- G01 - MEASURING TESTING
Information Patent Application
Electronic component, tester device and method for calibrating a te...
- Publication number 20030020488
- Publication date Jan 30, 2003
- Thomas Grebner
- G01 - MEASURING TESTING