Membership
Tour
Register
Log in
Thomas H. Jeys
Follow
Person
Lexington, MA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Material property determination using photothermal speckle detection
Patent number
10,605,662
Issue date
Mar 31, 2020
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for sensing targets using photothermal speckle...
Patent number
10,228,284
Issue date
Mar 12, 2019
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring a position of a particle in a flow
Patent number
8,867,046
Issue date
Oct 21, 2014
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring a position of a particle in a flow
Patent number
8,319,965
Issue date
Nov 27, 2012
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting and discriminating particles in...
Patent number
7,920,261
Issue date
Apr 5, 2011
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring a position of a particle in a flow
Patent number
7,821,636
Issue date
Oct 26, 2010
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for simultaneously measuring a three dimension...
Patent number
7,772,579
Issue date
Aug 10, 2010
Massachusetts Institute of Technology
William D. Herzog
G01 - MEASURING TESTING
Information
Patent Grant
Bio-particle fluorescence detector
Patent number
6,194,731
Issue date
Feb 27, 2001
The United States of America as represented by the Secretary of the Air Force
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Grant
Multi-pass optical parametric generator
Patent number
5,751,472
Issue date
May 12, 1998
Massachusetts Institute of Technology
Thomas H. Jeys
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
Material Property Determination Using Photothermal Speckle Detection
Publication number
20190250038
Publication date
Aug 15, 2019
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Application
DEVICES AND METHODS FOR SENSING TARGETS USING PHOTOTHERMAL SPECKLE...
Publication number
20170211977
Publication date
Jul 27, 2017
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Performing Spectral Classification
Publication number
20140160476
Publication date
Jun 12, 2014
Massachusetts Institute of Technology
Anish Kumar Goyal
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING A POSITION OF A PARTICLE IN A FLOW
Publication number
20130077096
Publication date
Mar 28, 2013
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Measuring a Position of a Particle in a Flow
Publication number
20110051137
Publication date
Mar 3, 2011
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING AND DISCRIMINATING PARTICLES IN...
Publication number
20100053614
Publication date
Mar 4, 2010
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for simultaneously measuring a three dimension...
Publication number
20080068605
Publication date
Mar 20, 2008
William D. Herzog
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring a position of a particle in a flow
Publication number
20080030716
Publication date
Feb 7, 2008
Thomas H. Jeys
G01 - MEASURING TESTING