Membership
Tour
Register
Log in
Thomas H. Windhorn
Follow
Person
Beverly, MA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for monitoring the condition of plasma equipment
Patent number
7,227,624
Issue date
Jun 5, 2007
Tokyo Electron Limited
Steven T. Fink
G01 - MEASURING TESTING
Information
Patent Grant
Method and assembly for providing impedance matching network and ne...
Patent number
7,212,078
Issue date
May 1, 2007
Tokyo Electron Limited
Thomas H Windhorn
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Electrically controlled plasma uniformity in a high density plasma...
Patent number
7,019,253
Issue date
Mar 28, 2006
Tokyo Electron Limited
Wayne L. Johnson
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Probe cartridge assembly and multi-probe assembly
Patent number
7,005,842
Issue date
Feb 28, 2006
Tokyo Electron Limited
Steven T. Fink
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for attenuating harmonics in semiconductor plasma...
Patent number
6,812,646
Issue date
Nov 2, 2004
Tokyo Electron Limited
Thomas H. Windhorn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Structure and the method for measuring the spectral content of an e...
Patent number
6,806,650
Issue date
Oct 19, 2004
Tokyo Electron Limited
Wayne L. Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for coupling two circuit components which have di...
Patent number
6,700,458
Issue date
Mar 2, 2004
Tokyo Electron Limited
Andrej S. Mitrovic
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Close coupled match structure for RF drive electrode
Patent number
6,657,395
Issue date
Dec 2, 2003
Tokyo Electron Limited
Thomas H. Windhorn
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for monitoring the condition of plasma equipment
Publication number
20040184028
Publication date
Sep 23, 2004
Steven T. Fink
G01 - MEASURING TESTING
Information
Patent Application
Method and assembly for providing impedance matching network and ne...
Publication number
20040163594
Publication date
Aug 26, 2004
TOKYO ELECTRON LIMITED
Thomas H. Windhorn
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Probe cartridge assembly and multi-probe assembly
Publication number
20040113603
Publication date
Jun 17, 2004
Steven T Fink
G01 - MEASURING TESTING
Information
Patent Application
Close coupled match structure for RF drive electrode
Publication number
20030141825
Publication date
Jul 31, 2003
Thomas H. Windhorn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for improving electron ecceleration
Publication number
20030094239
Publication date
May 22, 2003
Bill H. Quon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and device for attenuating harmonics in semiconductor plasma...
Publication number
20030057844
Publication date
Mar 27, 2003
Thomas H. Windhorn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Structure and the method for measuring the spectral content of an e...
Publication number
20030052664
Publication date
Mar 20, 2003
Wayne L. Johnson
G01 - MEASURING TESTING
Information
Patent Application
Device and method for coupling two circuit components which have di...
Publication number
20030038688
Publication date
Feb 27, 2003
Andrej S. Mitrovic
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrically controlled plasma uniformity in a high density plasma...
Publication number
20030006019
Publication date
Jan 9, 2003
Wayne L. Johnson
H01 - BASIC ELECTRIC ELEMENTS