Thomas Hantschel

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Amesdorf, DE

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Patents Grantslast 30 patents

Information Patent Grant
Probe tip and method of manufacturing probe tips by peel-off
- Patent number 6,756,584
- Issue date Jun 29, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Probe and method of manufacturing mounted AFM probes
- Patent number 6,690,008
- Issue date Feb 10, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip configuration and a method of fabrication thereof
- Patent number 6,504,152
- Issue date Jan 7, 2003
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip configuration and a method of fabrication thereof
- Patent number 6,328,902
- Issue date Dec 11, 2001
- Imec VZW
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Probe and method of manufacturing mounted AFM probes
- Publication number 20020079445
- Publication date Jun 27, 2002
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe tip and method of manufacturing tips and probes for detecting...
- Publication number 20020047091
- Publication date Apr 25, 2002
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe tip configuration and a method of fabrication thereof
- Publication number 20020040884
- Publication date Apr 11, 2002
- Thomas Hantschel
- B82 - NANO-TECHNOLOGY