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Thomas Hendrik Rozijn
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Eindhoven, NL
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Patents Grants
last 30 patents
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Patent Grant
Metal resistant MR imaging reference scan
Patent number
9,977,108
Issue date
May 22, 2018
Koniklijke Philips N.V.
Kay Nehrke
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Electric properties tomography imaging method and system
Patent number
9,638,777
Issue date
May 2, 2017
Koninklijke Philips N.V.
Tobias Ratko Voigt
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Image intensity correction for magnetic resonance imaging
Patent number
9,036,884
Issue date
May 19, 2015
Koninklijke Philips N.V.
Paul R. Harvey
G01 - MEASURING TESTING
Information
Patent Grant
MR imaging using multi-channel RF excitation
Patent number
8,938,281
Issue date
Jan 20, 2015
Koninklijke Philips N.V.
Miha Fuderer
G01 - MEASURING TESTING
Information
Patent Grant
MR imaging using parallel signal acquisition
Patent number
8,866,476
Issue date
Oct 21, 2014
Koninklijke Philips N.V.
Miha Fuderer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METAL RESISTANT MR IMAGING REFERENCE SCAN
Publication number
20150253406
Publication date
Sep 10, 2015
Koninklijke Philips N.V.
Kay Nehrke
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC PROPERTIES TOMOGRAPHY IMAGING METHOD AND SYSTEM
Publication number
20120306493
Publication date
Dec 6, 2012
Koninklijke Philips Electronics N.V.
Tobias Ratko Voigt
G01 - MEASURING TESTING
Information
Patent Application
MR IMAGING USING MULTI-CHANNEL RF EXCITATION
Publication number
20120179023
Publication date
Jul 12, 2012
Koninklijke Philips Electronics N.V.
Miha Fuderer
G01 - MEASURING TESTING
Information
Patent Application
IMAGE INTENSITY CORRECTION FOR MAGNETIC RESONANCE IMAGING
Publication number
20120163692
Publication date
Jun 28, 2012
Koninklijke Philips Electronics N.V.
Paul R. Harvey
G01 - MEASURING TESTING
Information
Patent Application
MR IMAGING USING PARALLEL SIGNAL ACQUISITION
Publication number
20120001633
Publication date
Jan 5, 2012
Koninklijke Philips Electronics N.V.
Miha Fuderer
G01 - MEASURING TESTING