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Thomas Henkel
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Boblingen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for testing a device-under-test
Patent number
9,274,175
Issue date
Mar 1, 2016
Advantest Corporation
Gil Golov
G01 - MEASURING TESTING
Information
Patent Grant
Transfer clocks for a multi-channel architecture
Patent number
8,170,164
Issue date
May 1, 2012
Advantest (Singapore) Pte Ltd
Thomas Henkel
G01 - MEASURING TESTING
Information
Patent Grant
Shared storage arbitration
Patent number
7,216,182
Issue date
May 8, 2007
Agilent Technologies, Inc.
Thomas Henkel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory latency compensation
Patent number
6,351,793
Issue date
Feb 26, 2002
Agilent Technologies, Inc.
Thomas Henkel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optimized memory organization in a multi-channel architecture
Patent number
6,304,947
Issue date
Oct 16, 2001
Agilent Technologies, Inc.
Ralf Killig
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR TESTING A DEVICE-UNDER-TEST
Publication number
20130193993
Publication date
Aug 1, 2013
Gil Golov
G01 - MEASURING TESTING
Information
Patent Application
Transfer clocks for a multi-channel architecture
Publication number
20040243870
Publication date
Dec 2, 2004
AGILENT TECHNOLOGIES, INC.
Thomas Henkel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Shared storage arbitration
Publication number
20040243900
Publication date
Dec 2, 2004
AGILENT TECHNOLOGIES, INC.
Thomas Henkel
G06 - COMPUTING CALCULATING COUNTING