Thomas Hingst

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for matching two measurement methods for measuring structure...
- Patent number 7,230,241
- Issue date Jun 12, 2007
- Infineon Technologies AG
- Manfred Moert
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and device for monitoring the etching operation for a regula...
- Publication number 20050239223
- Publication date Oct 27, 2005
- Infineon Technologies AG
- Ulrich Mantz
- G01 - MEASURING TESTING
Information Patent Application
Method for matching two measurement methods for measuring structure...
- Publication number 20050189489
- Publication date Sep 1, 2005
- Infineon Technologies AG
- Manfred Moert
- G01 - MEASURING TESTING