Thomas Huntington Lish

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Templeton, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Measurement device and method of its operation
- Patent number 11,567,111
- Issue date Jan 31, 2023
- Setra Systems, Inc.
- Eric Christopher Beishline
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and method of its operation
- Patent number 11,493,545
- Issue date Nov 8, 2022
- Setra Systems, Inc.
- Eric Christopher Beishline
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT DEVICE AND METHOD OF ITS OPERATION
- Publication number 20200150158
- Publication date May 14, 2020
- SETRA SYSTEMS, INC.
- Eric Christopher Beishline
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND METHOD OF ITS OPERATION
- Publication number 20200150163
- Publication date May 14, 2020
- SETRA SYSTEMS, INC.
- Eric Christopher Beishline
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR