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Thomas Iffland
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Jena, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for wavelength calibration of an optical measurement system
Patent number
7,411,665
Issue date
Aug 12, 2008
Leica Microsystems CMS GmbH
Thomas Iffland
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatic focusing an imaging optical system on the surf...
Patent number
7,041,952
Issue date
May 9, 2006
Leica Microsystems Jena GmbH
Thomas Iffland
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
Device for holding disk-shaped objects
Publication number
20090309285
Publication date
Dec 17, 2009
Vistec Semiconductor Systems Jena GmbH
Rene Schenck
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE FOR RECORDING A NUMBER OF IMAGES OF DISK-SHAPED OBJECTS
Publication number
20090237653
Publication date
Sep 24, 2009
CHROMASENS GMBH
Markus Schnitzlein
G01 - MEASURING TESTING
Information
Patent Application
Method of determining geometric parameters of a wafer
Publication number
20080208523
Publication date
Aug 28, 2008
Vistec Semiconductor Systems GmbH
Rene Schenck
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for holding disk-like objects
Publication number
20080203636
Publication date
Aug 28, 2008
VISTEC Semiconductor Systems Jena GmbH
Rene Schenck
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Method for wavelength calibration of an optical measurement system
Publication number
20060158649
Publication date
Jul 20, 2006
Leica Microsystems CMS GmbH
Thomas Iffland
G01 - MEASURING TESTING
Information
Patent Application
System for inspection of a disk-shaped object
Publication number
20060119366
Publication date
Jun 8, 2006
Leica Microsystems Jena GmbH
Thomas Iffland
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for Inspecting the front side and backside of a disk-shap...
Publication number
20060119367
Publication date
Jun 8, 2006
Leica Microsystems Jena GmbH
Thomas Iffland
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for acquiring a complete image of a surface of...
Publication number
20050225632
Publication date
Oct 13, 2005
Leica Microsystems Jena GmbH
Thomas Iffland
G01 - MEASURING TESTING
Information
Patent Application
Method for automatic focusing
Publication number
20040169124
Publication date
Sep 2, 2004
LEICA MICROSYSTEMS JENA GmbH
Thomas Iffland
G02 - OPTICS