Thomas J. Dunn

Person

Mohegan Lake, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems for and methods of measuring photomask flatness with reduce...
- Patent number 10,871,369
- Issue date Dec 22, 2020
- Corning Incorporated
- Thomas James Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Edge registration for interferometry
- Patent number 10,488,176
- Issue date Nov 26, 2019
- Corning Incorporated
- Thomas James Dunn
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric roll-off measurement using a static fringe pattern
- Patent number 9,829,310
- Issue date Nov 28, 2017
- Corning Incorporated
- Alexander Timothy Bean
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Grazing-incidence interferometer with dual-side measurement capabil...
- Patent number 9,651,358
- Issue date May 16, 2017
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Grant
Skewed sectional measurement of striated glass
- Patent number 9,513,214
- Issue date Dec 6, 2016
- Corning Incorporated
- Paul Gerard Dewa
- G02 - OPTICS
Information Patent Grant
Frequency-shifting interferometer with selective data processing
- Patent number 8,531,677
- Issue date Sep 10, 2013
- Corning Incorporated
- Thomas James Dunn
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with paraboloidal illumination and imaging optic and...
- Patent number 8,526,008
- Issue date Sep 3, 2013
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Grant
Littman configured frequency stepped laser
- Patent number 8,218,586
- Issue date Jul 10, 2012
- Corning Incorporated
- Thomas James Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Current driven frequency-stepped radiation source and methods thereof
- Patent number 7,916,763
- Issue date Mar 29, 2011
- Corning Incorporated
- Thomas James Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlapping common-path interferometers for two-sided measurement
- Patent number 7,268,887
- Issue date Sep 11, 2007
- Corning Incorporated
- Andrew W. Kulawiec
- G01 - MEASURING TESTING
Information Patent Grant
Optical feedback from mode-selective tuner
- Patent number 7,259,860
- Issue date Aug 21, 2007
- Corning Incorporated
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Grant
Mode-selective frequency tuning system
- Patent number 7,209,499
- Issue date Apr 24, 2007
- Corning Incorporated
- Nestor Farmiga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-wavelength confocal interferometer for measuring multiple surfaces
- Patent number 6,781,699
- Issue date Aug 24, 2004
- Corning-Tropel
- Thomas J. Dunn
- G01 - MEASURING TESTING
Information Patent Grant
Seamless, maskless lithography system using spatial light modulator
- Patent number 6,312,134
- Issue date Nov 6, 2001
- Anvik Corporation
- Kanti Jain
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Microlithography system for high-resolution large-area patterning o...
- Patent number 6,304,316
- Issue date Oct 16, 2001
- Anvik Corporation
- Kanti Jain
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for projection patterning of large substrates using limit...
- Patent number 6,201,597
- Issue date Mar 13, 2001
- Anvik Corporation
- Thomas J. Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Ultraviolet-based, large-area scanning system for photothermal proc...
- Patent number 6,149,856
- Issue date Nov 21, 2000
- Anvik Corporation
- Marc I. Zemel
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
High-speed drilling system for micro-via pattern formation, and res...
- Patent number 6,040,552
- Issue date Mar 21, 2000
- Kanti Jain
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Very large area patterning system for flexible substrates
- Patent number 6,018,383
- Issue date Jan 25, 2000
- Anvik Corporation
- Thomas J. Dunn
- G02 - OPTICS
Information Patent Grant
Double-sided patterning system using dual-wavelength output of an e...
- Patent number 5,933,216
- Issue date Aug 3, 1999
- Anvik Corporation
- Thomas J. Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Projection patterning of large substrates using limited-travel x-y...
- Patent number 5,897,986
- Issue date Apr 27, 1999
- Anvik Corporation
- Thomas J. Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Absolute distance measuring interferometry using multi-pass resonan...
- Patent number 5,555,089
- Issue date Sep 10, 1996
- Anvik Corporation
- Thomas J. Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Transporter for optical spectrum analyzer in alignment system
- Patent number 5,502,563
- Issue date Mar 26, 1996
- Anvik Corporation
- Thomas J. Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS FOR AND METHODS OF MEASURING PHOTOMASK FLATNESS WITH REDUCE...
- Publication number 20200041248
- Publication date Feb 6, 2020
- Corning Incorporated
- Thomas James Dunn
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EDGE REGISTRATION FOR INTERFEROMETRY
- Publication number 20170363414
- Publication date Dec 21, 2017
- Corning Incorporated
- THOMAS JAMES DUNN
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ROLL-OFF MEASUREMENT USING A STATIC FRINGE PATTERN
- Publication number 20170003120
- Publication date Jan 5, 2017
- Corning Incorporated
- Alexander Timothy Bean
- G01 - MEASURING TESTING
Information Patent Application
GRAZING-INCIDENCE INTERFEROMETER WITH DUAL-SIDE MEASUREMENT CAPABILITY
- Publication number 20150049337
- Publication date Feb 19, 2015
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Application
SKEWED SECTIONAL MEASUREMENT OF STRIATED GLASS
- Publication number 20150009487
- Publication date Jan 8, 2015
- Corning Incorporated
- Paul Gerard Dewa
- G02 - OPTICS
Information Patent Application
INTERFEROMETER WITH PARABOLOIDAL ILLUMINATION AND IMAGING OPTIC AND...
- Publication number 20120154819
- Publication date Jun 21, 2012
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-SHIFTING INTERFEROMETER WITH SELECTIVE DATA PROCESSING
- Publication number 20110292405
- Publication date Dec 1, 2011
- Thomas James Dunn
- G01 - MEASURING TESTING
Information Patent Application
Current Driven Frequency-Stepped Radiation Source and Methods Thereof
- Publication number 20100128745
- Publication date May 27, 2010
- Thomas James Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Littman Configured Frequency Stepped Laser
- Publication number 20100128746
- Publication date May 27, 2010
- Thomas James Dunn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Overlapping common-path interferometers for two-sided measurement
- Publication number 20060139656
- Publication date Jun 29, 2006
- Corning Incorporated
- Andrew Kulawiec
- G01 - MEASURING TESTING
Information Patent Application
Optical feedback from mode-selective tuner
- Publication number 20060062260
- Publication date Mar 23, 2006
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
Mode-selective frequency tuning system
- Publication number 20060062261
- Publication date Mar 23, 2006
- Nestor Farmiga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-wavelength confocal interferometer for measuring multiple surfaces
- Publication number 20040075842
- Publication date Apr 22, 2004
- Thomas J. Dunn
- G01 - MEASURING TESTING

Thomas J. Dunn

Person

Patents Grantslast 30 patents

Systems for and methods of measuring photomask flatness with reduce...

Edge registration for interferometry

Interferometric roll-off measurement using a static fringe pattern

Grazing-incidence interferometer with dual-side measurement capabil...

Skewed sectional measurement of striated glass

Frequency-shifting interferometer with selective data processing

Interferometer with paraboloidal illumination and imaging optic and...

Littman configured frequency stepped laser

Current driven frequency-stepped radiation source and methods thereof

Overlapping common-path interferometers for two-sided measurement

Optical feedback from mode-selective tuner

Mode-selective frequency tuning system

Two-wavelength confocal interferometer for measuring multiple surfaces

Seamless, maskless lithography system using spatial light modulator

Microlithography system for high-resolution large-area patterning o...

Apparatus for projection patterning of large substrates using limit...

Ultraviolet-based, large-area scanning system for photothermal proc...

High-speed drilling system for micro-via pattern formation, and res...

Very large area patterning system for flexible substrates

Double-sided patterning system using dual-wavelength output of an e...

Projection patterning of large substrates using limited-travel x-y...

Absolute distance measuring interferometry using multi-pass resonan...

Transporter for optical spectrum analyzer in alignment system

Patents Applicationslast 30 patents

SYSTEMS FOR AND METHODS OF MEASURING PHOTOMASK FLATNESS WITH REDUCE...

EDGE REGISTRATION FOR INTERFEROMETRY

INTERFEROMETRIC ROLL-OFF MEASUREMENT USING A STATIC FRINGE PATTERN

GRAZING-INCIDENCE INTERFEROMETER WITH DUAL-SIDE MEASUREMENT CAPABILITY

SKEWED SECTIONAL MEASUREMENT OF STRIATED GLASS

INTERFEROMETER WITH PARABOLOIDAL ILLUMINATION AND IMAGING OPTIC AND...

FREQUENCY-SHIFTING INTERFEROMETER WITH SELECTIVE DATA PROCESSING

Current Driven Frequency-Stepped Radiation Source and Methods Thereof

Littman Configured Frequency Stepped Laser

Overlapping common-path interferometers for two-sided measurement

Optical feedback from mode-selective tuner

Mode-selective frequency tuning system

Two-wavelength confocal interferometer for measuring multiple surfaces