Thomas J. Jaite

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Willoughby Hills, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Multi-position probe circuit tester
- Patent number 8,368,415
- Issue date Feb 5, 2013
- SPX Corporation
- Thomas J. Jaite
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multi-Position Probe Circuit Tester
- Publication number 20100213961
- Publication date Aug 26, 2010
- Thomas J. Jaite
- G01 - MEASURING TESTING