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Thomas J. McKeone
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Austin, TX, US
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last 30 patents
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Patent Grant
System and method for specifying integrated circuit probe locations
Patent number
6,957,413
Issue date
Oct 18, 2005
Advanced Micro Devices, Inc.
Tom McKeone
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Integrated circuit heating system and method therefor
Patent number
6,879,172
Issue date
Apr 12, 2005
Advanced Micro Devices, Inc.
David Eppes
G01 - MEASURING TESTING
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Patent Grant
Integrated circuit internal heating system and method therefor
Patent number
6,815,965
Issue date
Nov 9, 2004
Advanced Micro Devices, Inc.
David Eppes
G01 - MEASURING TESTING