Thomas J. Sharp

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Tigard, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Input by-pass circuit for a current probe
- Patent number 7,358,717
- Issue date Apr 15, 2008
- Tektronix, Inc.
- Jonathan S. Dandy
- G01 - MEASURING TESTING
Information Patent Grant
Current probing system
- Patent number 7,294,995
- Issue date Nov 13, 2007
- Tektronix, Inc.
- Kerry A. Stevens
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Input by-pass circuit for a current probe
- Publication number 20070273361
- Publication date Nov 29, 2007
- Jonathan S. Dandy
- G01 - MEASURING TESTING
Information Patent Application
Current probing system
- Publication number 20070257661
- Publication date Nov 8, 2007
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
CURRENT PROBING SYSTEM
- Publication number 20070257657
- Publication date Nov 8, 2007
- Kerry A. Stevens
- G01 - MEASURING TESTING
Information Patent Application
Current probe
- Publication number 20070257662
- Publication date Nov 8, 2007
- Michael J. Mende
- G01 - MEASURING TESTING