Thomas J. Sonderman

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Process control using analysis of an upstream process
- Patent number 8,615,314
- Issue date Dec 24, 2013
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Parallel fault detection
- Patent number 8,359,494
- Issue date Jan 22, 2013
- GLOBALFOUNDRIES Inc.
- Elfido Coss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic adaptive sampling rate for model prediction
- Patent number 8,017,411
- Issue date Sep 13, 2011
- GLOBALFOUNDRIES, INC.
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma state monitoring to control etching processes and across-waf...
- Patent number 7,402,257
- Issue date Jul 22, 2008
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Run-to-run control method for automated control of metal deposition...
- Patent number 7,324,865
- Issue date Jan 29, 2008
- Advanced Micro Devices, Inc.
- Thomas Sonderman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Total tool control for semiconductor manufacturing
- Patent number 7,292,959
- Issue date Nov 6, 2007
- Advanced Mirco Devices, Inc.
- Richard J. Markle
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Secondary process controller for supplementing a primary process co...
- Patent number 7,254,453
- Issue date Aug 7, 2007
- Advanced Micro Devices, Inc.
- Richard J. Markle
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Methods of controlling properties and characteristics of a gate ins...
- Patent number 7,160,740
- Issue date Jan 9, 2007
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining transmission of error effects for improving parametric...
- Patent number 7,117,062
- Issue date Oct 3, 2006
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for initializing tool controllers based on too...
- Patent number 7,103,439
- Issue date Sep 5, 2006
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for updating control state variables of a proc...
- Patent number 6,970,757
- Issue date Nov 29, 2005
- Advanced Micro Devices, Inc.
- Joyce S. Oey Hewett
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for dynamically monitoring controller tuning p...
- Patent number 6,961,636
- Issue date Nov 1, 2005
- Advanced Micro Devices Inc.
- Robert J. Chong
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for controlling process target values based on...
- Patent number 6,937,914
- Issue date Aug 30, 2005
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Process control based on an estimated process result
- Patent number 6,925,347
- Issue date Aug 2, 2005
- Advanced Micro Devices, Inc.
- Michael L. Miller
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for predicting electrical parameters using mea...
- Patent number 6,917,849
- Issue date Jul 12, 2005
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for distinguishing between sources of process...
- Patent number 6,901,340
- Issue date May 31, 2005
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling wafer thickness uniformity in...
- Patent number 6,850,322
- Issue date Feb 1, 2005
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control based upon a metrology delay
- Patent number 6,834,213
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for determining a sampling plan based on proce...
- Patent number 6,821,792
- Issue date Nov 23, 2004
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control methodology using optical emission spectroscopy derived dat...
- Patent number 6,818,561
- Issue date Nov 16, 2004
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for integrating multiple process controllers
- Patent number 6,801,817
- Issue date Oct 5, 2004
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method of controlling wafer charging effects due to manufacturing p...
- Patent number 6,800,562
- Issue date Oct 5, 2004
- Advanced Micro Devices, Inc.
- Brian K. Cusson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for incorporating control simulation environment
- Patent number 6,802,045
- Issue date Oct 5, 2004
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for adaptively scheduling tool maintenance
- Patent number 6,785,586
- Issue date Aug 31, 2004
- Advanced Micro Devices, Inc.
- Anthony J. Toprac
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dynamic targeting for a process control system
- Patent number 6,773,931
- Issue date Aug 10, 2004
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Dynamic process state adjustment of a processing tool to reduce non...
- Patent number 6,751,518
- Issue date Jun 15, 2004
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining control actions incorporating...
- Patent number 6,745,086
- Issue date Jun 1, 2004
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for utilizing integrated metrology data as fee...
- Patent number 6,708,075
- Issue date Mar 16, 2004
- Advanced Micro Devices
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for prioritizing production lots based on grade estimates an...
- Patent number 6,699,727
- Issue date Mar 2, 2004
- Advanced Micro Devices Inc.
- Anthony J. Toprac
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for determining output characteristics using t...
- Patent number 6,678,570
- Issue date Jan 13, 2004
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Methods of controlling properties and characteristics of a gate ins...
- Publication number 20050009217
- Publication date Jan 13, 2005
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic adaptive sampling rate for model prediction
- Publication number 20040121495
- Publication date Jun 24, 2004
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Parallel fault detection
- Publication number 20040123182
- Publication date Jun 24, 2004
- Elfido Cross
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Secondary process controller for supplementing a primary process co...
- Publication number 20040102857
- Publication date May 27, 2004
- Richard J. Markle
- G05 - CONTROLLING REGULATING
Information Patent Application
Dynamic targeting for a process control system
- Publication number 20040029299
- Publication date Feb 12, 2004
- Alexander J. Pasadyn
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for utilizing integrated metrology data as fee...
- Publication number 20030097198
- Publication date May 22, 2003
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for controlling a thickness of a copper film
- Publication number 20020192944
- Publication date Dec 19, 2002
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for controlling feature critical dimensions ba...
- Publication number 20020177245
- Publication date Nov 28, 2002
- Thomas J. Sonderman
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for controlling wafer thickness uniformity in...
- Publication number 20020085212
- Publication date Jul 4, 2002
- William Jarrett Campbell
- H01 - BASIC ELECTRIC ELEMENTS

Thomas J. Sonderman

Person

Patents Grantslast 30 patents

Process control using analysis of an upstream process

Parallel fault detection

Dynamic adaptive sampling rate for model prediction

Plasma state monitoring to control etching processes and across-waf...

Run-to-run control method for automated control of metal deposition...

Total tool control for semiconductor manufacturing

Secondary process controller for supplementing a primary process co...

Methods of controlling properties and characteristics of a gate ins...

Determining transmission of error effects for improving parametric...

Method and apparatus for initializing tool controllers based on too...

Method and apparatus for updating control state variables of a proc...

Method and apparatus for dynamically monitoring controller tuning p...

Method and apparatus for controlling process target values based on...

Process control based on an estimated process result

Method and apparatus for predicting electrical parameters using mea...

Method and apparatus for distinguishing between sources of process...

Method and apparatus for controlling wafer thickness uniformity in...

Process control based upon a metrology delay

Method and apparatus for determining a sampling plan based on proce...

Control methodology using optical emission spectroscopy derived dat...

Method and apparatus for integrating multiple process controllers

Method of controlling wafer charging effects due to manufacturing p...

Method and apparatus for incorporating control simulation environment

Method and apparatus for adaptively scheduling tool maintenance

Dynamic targeting for a process control system

Dynamic process state adjustment of a processing tool to reduce non...

Method and apparatus for determining control actions incorporating...

Method and apparatus for utilizing integrated metrology data as fee...

Method for prioritizing production lots based on grade estimates an...

Method and apparatus for determining output characteristics using t...

Patents Applicationslast 30 patents

Methods of controlling properties and characteristics of a gate ins...

Dynamic adaptive sampling rate for model prediction

Parallel fault detection

Secondary process controller for supplementing a primary process co...

Dynamic targeting for a process control system

Method and apparatus for utilizing integrated metrology data as fee...

Method and apparatus for controlling a thickness of a copper film

Method and apparatus for controlling feature critical dimensions ba...

Method and apparatus for controlling wafer thickness uniformity in...