Thomas J. Tague, JR.

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Richmond, NH, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for in situ measurement of material properties...
- Patent number 7,787,117
- Issue date Aug 31, 2010
- Bruker Optics, Inc.
- Marco Leona
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROMETERS UTILIZING MID INFRARED ULTRA BROADBAND HIGH BRIGHTNES...
- Publication number 20110058176
- Publication date Mar 10, 2011
- BRUKER OPTICS, INC.
- Christian Pflugl
- G01 - MEASURING TESTING
Information Patent Application
LARGE AREA SCANNING APPARATUS FOR ANALYTE QUANTIFICATION BY SURFACE...
- Publication number 20100291599
- Publication date Nov 18, 2010
- BRUKER OPTICS, INC.
- Thomas J. Tague, JR.
- G01 - MEASURING TESTING