Thomas J. Wyrobek

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Edina, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Multi-scale & three-axis sensing tensile testing apparatus
- Patent number 7,681,459
- Issue date Mar 23, 2010
- Hysitron, Incorporated
- Dehua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring properties of interfacial adhesion
- Patent number 7,628,065
- Issue date Dec 8, 2009
- Hysitron, Inc.
- Dehua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring interfacial adhesion properties of electronic s...
- Patent number 7,287,418
- Issue date Oct 30, 2007
- Hysitron, Inc.
- Dehua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring properties of interfacial adhesion of medical d...
- Patent number 7,287,420
- Issue date Oct 30, 2007
- Hysitron, Inc.
- Dehua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring interfacial adhesion properties of stents
- Patent number 7,287,419
- Issue date Oct 30, 2007
- Hysitron, Inc.
- Dehua Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method for observation of microstructural surface features in heter...
- Patent number 7,107,694
- Issue date Sep 19, 2006
- Hysitron, Incorporated
- Dehua Yang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of measuring interfacial adhesion properties of stents
- Publication number 20060191327
- Publication date Aug 31, 2006
- Dehua Yang
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring properties of interfacial adhesion
- Publication number 20060137440
- Publication date Jun 29, 2006
- Dehua Yang
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring properties of interfacial adhesion of medical d...
- Publication number 20060137469
- Publication date Jun 29, 2006
- Dehua Yang
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring interfacial adhesion properties of electronic s...
- Publication number 20060137468
- Publication date Jun 29, 2006
- Dehua Yang
- G01 - MEASURING TESTING
Information Patent Application
Method for observation of microstructural surface features in heter...
- Publication number 20050283985
- Publication date Dec 29, 2005
- Dehua Yang
- G01 - MEASURING TESTING