Thomas Jarik Huisman

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Numerically compensating SEM-induced charging using diffusion-based...
- Patent number 12,255,042
- Issue date Mar 18, 2025
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of metrology and associated apparatuses
- Patent number 11,733,614
- Issue date Aug 22, 2023
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection tool and inspection method
- Patent number 11,668,661
- Issue date Jun 6, 2023
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection tool, lithographic apparatus, electron beam source and a...
- Patent number 11,243,179
- Issue date Feb 8, 2022
- ASML Netherlands B.V.
- Erwin Paul Smakman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of metrology and associated apparatuses
- Patent number 11,112,703
- Issue date Sep 7, 2021
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES
- Publication number 20250231129
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEM IMAGE ENHANCEMENT METHODS AND SYSTEMS
- Publication number 20250166960
- Publication date May 22, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...
- Publication number 20250003899
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20240297013
- Publication date Sep 5, 2024
- ASML NETHERLANDS B.V.
- Jasper Frans Mathijs VAN RENS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEM IMAGE ENHANCEMENT
- Publication number 20240212108
- Publication date Jun 27, 2024
- ASML NETHERLANDS B.V.
- Thomas Jarik HUISMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED O...
- Publication number 20240054669
- Publication date Feb 15, 2024
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REMOVING AN ARTIFACT FROM AN IMAGE
- Publication number 20230021320
- Publication date Jan 26, 2023
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NUMERICALLY COMPENSATING SEM-INDUCED CHARGING USING DIFFUSION-BASED...
- Publication number 20220293389
- Publication date Sep 15, 2022
- ASML NETHERLANDS B.V.
- Thomas Jarik HUISMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF METROLOGY AND ASSOCIATED APPARATUSES
- Publication number 20220107571
- Publication date Apr 7, 2022
- ASML NETHERLANDS B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION TOOL AND INSPECTION METHOD
- Publication number 20210003521
- Publication date Jan 7, 2021
- ASML NETHERLANDS B.V.
- Thomas Jarik HUISMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION TOOL, LITHOGRAPHIC APPARATUS, ELECTRON BEAM SOURCE AND A...
- Publication number 20200249181
- Publication date Aug 6, 2020
- ASML NETHERLANDS B.V.
- Erwin Paul SMAKMAN
- G01 - MEASURING TESTING
Information Patent Application
SEM IMAGE ENHANCEMENT METHODS AND SYSTEMS
- Publication number 20200018944
- Publication date Jan 16, 2020
- ASML Netherlands B.V.
- Wei FANG
- G02 - OPTICS
Information Patent Application
METHOD OF METROLOGY AND ASSOCIATED APPARATUSES
- Publication number 20190294055
- Publication date Sep 26, 2019
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Thomas Jarik Huisman

Person

Patents Grantslast 30 patents

Numerically compensating SEM-induced charging using diffusion-based...

Method of metrology and associated apparatuses

Inspection tool and inspection method

Inspection tool, lithographic apparatus, electron beam source and a...

Method of metrology and associated apparatuses

Patents Applicationslast 30 patents

E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES

SEM IMAGE ENHANCEMENT METHODS AND SYSTEMS

METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...

ALIGNING A DISTORTED IMAGE

SEM IMAGE ENHANCEMENT

APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED O...

REMOVING AN ARTIFACT FROM AN IMAGE

NUMERICALLY COMPENSATING SEM-INDUCED CHARGING USING DIFFUSION-BASED...

METHOD OF METROLOGY AND ASSOCIATED APPARATUSES

INSPECTION TOOL AND INSPECTION METHOD

INSPECTION TOOL, LITHOGRAPHIC APPARATUS, ELECTRON BEAM SOURCE AND A...

SEM IMAGE ENHANCEMENT METHODS AND SYSTEMS

METHOD OF METROLOGY AND ASSOCIATED APPARATUSES