Thomas Jasinski

Person

Munich, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device, interchangeable multi-aperture arrang...
- Patent number 10,978,270
- Issue date Apr 13, 2021
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, vacuum valve therefor and operation t...
- Patent number 8,502,163
- Issue date Aug 6, 2013
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Thomas Jasinski
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Modular gas ion source
- Patent number 8,101,922
- Issue date Jan 24, 2012
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas ion source with high mechanical stability
- Patent number 8,044,370
- Issue date Oct 25, 2011
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dieter Winkler
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Charged particle beam device with cleaning unit and method of opera...
- Patent number 7,355,186
- Issue date Apr 8, 2008
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Thomas Jasinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cooling module for charged particle beam column elements
- Patent number 7,345,287
- Issue date Mar 18, 2008
- Applied Materials, Inc.
- Thomas Jasinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflection system
- Patent number 5,847,399
- Issue date Dec 8, 1998
- ACT Advanced Circuit Testing Gesellschaft fur Testsystementwicklung mbH
- Reinhold Schmitt
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE, INTERCHANGEABLE MULTI-APERTURE ARRANG...
- Publication number 20200203116
- Publication date Jun 25, 2020
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, VACUUM VALVE THEREFOR AND OPERATION T...
- Publication number 20130118586
- Publication date May 16, 2013
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Thomas JASINSKI
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
GAS ION SOURCE WITH HIGH MECHANICAL STABILITY
- Publication number 20110315890
- Publication date Dec 29, 2011
- DIETER WINKLER
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
GAS ION SOURCE WITH HIGH MECHANICAL STABILITY
- Publication number 20090057566
- Publication date Mar 5, 2009
- ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
- Dieter WINKLER
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
MODULAR GAS ION SOURCE
- Publication number 20090020708
- Publication date Jan 22, 2009
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM APPARATUS AND METHOD FOR ALIGNING SAME
- Publication number 20080073583
- Publication date Mar 27, 2008
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Thomas JASINSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chamber with low electron stimulated desorption
- Publication number 20070138404
- Publication date Jun 21, 2007
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cooling module for charged particle beam column elements
- Publication number 20070085019
- Publication date Apr 19, 2007
- Thomas Jasinski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device with cleaning unit and method of opera...
- Publication number 20060231772
- Publication date Oct 19, 2006
- Thomas Jasinski
- H01 - BASIC ELECTRIC ELEMENTS

Thomas Jasinski

Person

Patents Grantslast 30 patents

Charged particle beam device, interchangeable multi-aperture arrang...

Charged particle beam device, vacuum valve therefor and operation t...

Modular gas ion source

Gas ion source with high mechanical stability

Charged particle beam device with cleaning unit and method of opera...

Cooling module for charged particle beam column elements

Deflection system

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE, INTERCHANGEABLE MULTI-APERTURE ARRANG...

CHARGED PARTICLE BEAM DEVICE, VACUUM VALVE THEREFOR AND OPERATION T...

GAS ION SOURCE WITH HIGH MECHANICAL STABILITY

GAS ION SOURCE WITH HIGH MECHANICAL STABILITY

MODULAR GAS ION SOURCE

ION BEAM APPARATUS AND METHOD FOR ALIGNING SAME

Chamber with low electron stimulated desorption

Cooling module for charged particle beam column elements

Charged particle beam device with cleaning unit and method of opera...