Thomas John ANDERSON

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor outlier identification using serially-combined data t...
- Patent number 8,126,681
- Issue date Feb 28, 2012
- Texas Instruments Incorporated
- Amit V Nahar
- G01 - MEASURING TESTING
Information Patent Grant
Identification of outlier semiconductor devices using data-driven s...
- Patent number 7,494,829
- Issue date Feb 24, 2009
- Texas Instruments Incorporated
- Suresh Subramaniam
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating the early failure rate of semiconductor devices
- Patent number 7,292,058
- Issue date Nov 6, 2007
- Texas Instruments Incorporated
- Thomas J. Anderson
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR OUTLIER IDENTIFICATION USING SERIALLY-COMBINED DATA T...
- Publication number 20110071782
- Publication date Mar 24, 2011
- TEXAS INSTRUMENTS INCORPORATED
- AMIT V. NAHAR
- G01 - MEASURING TESTING
Information Patent Application
Identification of Outlier Semiconductor Devices Using Data-Driven S...
- Publication number 20080262793
- Publication date Oct 23, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Suresh SUBRAMANIAM
- G01 - MEASURING TESTING
Information Patent Application
Method for estimating the early failure rate of semiconductor devices
- Publication number 20060107094
- Publication date May 18, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Thomas J. Anderson
- G06 - COMPUTING CALCULATING COUNTING