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Thomas John Francis
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South Portland, ME, US
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last 30 patents
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Patent Grant
System and method for monitoring chloride content and concentration...
Patent number
8,481,142
Issue date
Jul 9, 2013
National Semiconductor Corporation
Thanas Budri
G01 - MEASURING TESTING
Information
Patent Grant
Method of avoiding unwanted metal deposition on a semiconductor res...
Patent number
7,754,558
Issue date
Jul 13, 2010
National Semiconductor Corporation
Reshmi Mitra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having a minimal via resistance created by app...
Patent number
7,531,896
Issue date
May 12, 2009
National Semiconductor Corporation
Sergei Drizlikh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for providing contact etch selectivity using RIE...
Patent number
7,504,340
Issue date
Mar 17, 2009
National Semiconductor Corporation
Sergei Drizlikh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High Q inductor integration
Patent number
7,247,544
Issue date
Jul 24, 2007
National Semiconductor Corporation
Sergei Drizlikh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for minimizing increases in via resistance by app...
Patent number
7,101,787
Issue date
Sep 5, 2006
National Semiconductor Corporation
Sergei Drizlikh
H01 - BASIC ELECTRIC ELEMENTS